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Analog Input Test
DCOut Loopback Test
ECGOut/QRSTrigger Loopback Test
Floppy Drive Tests
Internal Memory Tests
4-16
Troubleshooting: Diagnostic Tests
Follow the instructions on screen to connect a DC power supply to the DC input pins
of the ANA/TTL connector. The voltage of the DC input displays. If test fails, the
main CPU board may need to be replaced.
Follow the instructions on screen to connect the DC Outputs to the Analog Inputs.
The test sends all possible values out the DC Outputs and confirms that the correct
values are read from the Analog Inputs. A pass/fail result displays. If either test fails,
the main CPU board may need to be replaced.
NOTE
Pin numbers refer to the ANA/TTL port.
Follow the instructions on screen to connect the ECG Output and QRS Trigger
Output to the Analog Inputs. The test sends all possible values out the ECG Output
and a square wave out the QRS Trigger Output. It confirms that the correct values
are read from the Analog Inputs. A pass/fail result displays. If either test fails, the
main CPU board may need to be replaced.
NOTE
Pin numbers refer to the ANA/TTL port.
This test does not apply to the MAC 5500 system.
Follow the instructions on screen. A read/write test is performed on a formatted
floppy disk and a pass/fail test result is displayed. Try another disk if this test fails. If
this test continues to fail, contact GE Medical Systems-Information Technologies
for service.
NOTE
The following test and the resultant values are for manufacturing use only and
NOT intended for service of this device.
A head radial alignment and Azimuth alignment test is performed using an Accurite
test disk (part number is displayed on screen). Alignment test values will be
displayed.
This test checks the internal storage memory of the unit.
1.
Select Internal Memory Tests from the System Diagnostics Main Menu.
The number of bad blocks and the amount of free memory displays.
2.
Press any key to continue.
A prompt appears asking Do you want to format Internal Memory?
MAC 5500 resting ECG analysis system
2020299-020
Revision E
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