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The Analyzer Hardware
Self-tests description
Self-tests description
The self-tests identify the correct operation of major functional areas in the
logic analyzer. The self-tests are not intended for component-level
diagnostics.
Three types of tests are performed on the HP 1660CP-series logic analyzers:
the power-up self-tests, the functional performance verification self-tests,
and the parametric performance verification tests.
The power-up self-tests are performed when power is applied to the
instrument. The power-up self-tests are divided into two parts. The first part
is the system memory tests and the second part is the microprocessor
interrupt test. The system memory tests are performed before the logic
analyzer actually displays the power-up self-test screen. Both the system
ROM and RAM are tested during power-up. The interrupt test is performed
after the power-up self-test screen is displayed.
The functional performance verification self-tests are run using a separate
operating system, the performance verification (PV) operating system. The
PV operating system resides on a separate disk that must be loaded when
running the functional performance verification self-tests. The system and
analyzer tests are functional performance verification tests.
Parametric performance verification requires the use of external test
equipment that generates and monitors test data for the logic analyzer to
read. Refer to the HP 1660C/CS/CP-Series Logic Analyzers Service Guide
for further information about parametric performance verification.
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Troubleshooting
