Dynamic Test Function - ITech IT8300 Series User Manual

the load will trigger an operation.

Timing trigger: when the timing trigger is valid, the load will automatically
trigger an operation at intervals.

Trigger holding: when trigger holding is valid, only when the load receives
trigger command (TRIG:IMM), the load will trigger an operation.

Bus trigger: when the bus trigger is valid, after the load receives a trigger
command (GET or * TRG) from GPIB port, the load will trigger an
operation.
Select the triggering sources as follows:

3.10 Dynamic test function

Through dynamic test operation, the electronic load can be switched between
two setting parameters based on setting rules. This function can be used to test
dynamic performances of power supply. For dynamic test operation, press
[Shift] + 2 (Tran) key on the front board to enter the dynamic test menu. Before
test, firstly, set parameters related to dynamic test operation, including dynamic
test mode, A value, B value, pulse width time, frequency, duty ratio, etc. Under
CC mode, current ascending and descending slopes should be set for dynamic
test.
The dynamic test mode can be divided into continuous mode, pulse mode and
toggle mode.
3.10.1 Continuous mode
Under continuous mode, after enabling dynamic test operation, the load will be
switched continuously between A value and B value.
When output voltage and current of the tested instrument are 10 V and 3 A
respectively, the load current will switch between 1 A and 2 A. Set the dynamic
test parameters and perform the test as follows:
1. Press [Shift] + 2 (Tran) keys.
TRANSITION
On
2. Operate
Continuous. Press [Enter] key.
TRANSITION
Continuous Pulse Toggle
Dynamic test in continuous mode
Off
key and move to Off. Press [Enter] key and select
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Function and Features
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