Table of Contents
Advertisement
ES3000 V5 NVMe PCIe SSD
User Guide
Bit
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
24:20
25
26
27
28
29
30
31
A.6.2.1.8 Obtaining the DIEID of a Chip
This command is used to obtain the DIEID, which is the unique identifier of a chip and is
used to track and manage information of the entire lifecycle (including chip manufacturing,
chip test, board processing, server test, and live network operation).
This command uses the PRP1, PRP2, Dword10, and Dword12 fields. Enter reserved value 0
for fields that are not involved.
Issue 07 (2019-03-19)
Description
DDR uncorrectable error test
IBUF uncorrectable error test
Capacitor test
Blank block test: insufficient blank blocks
Life test
NOR patrol test
Firmware uncorrectable error test: four invalid firmware backups
System area test too many bad blocks in the NAND system area
Bad block test: too many bad blocks in the NAND data area
Controller test: invalid controller
Power down fast interrupt request (FIQ) test
Formatting failure test
DB poweron fail test
Reserved
Lbn miss happen test
Deep rebuild happen Test
Reserved
1: Firmware needs to be upgraded to restore SSD disks.
1: Data loss risks exist.
1: SSD disks can be restored, but risks exist.
1: SSD disks can be restored.
1: Forcibly restore SSD disks so that the SSD disks can function properly.
1: Restart or power on and then off SSD disks to restore SSD disks.
1: The fault cannot be rectified. Contact Huawei support engineers.
Copyright © Huawei Technologies Co., Ltd.
A Supported NVMe Commands
195
Advertisement
Table of Contents
