Obtaining The Dieid Of A Chip - Huawei ES3000 V5 User Manual

ES3000 V5 NVMe PCIe SSD
User Guide
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A.6.1.1.8 Obtaining the DIEID of a Chip
This command is used to obtain the DIEID, which is the unique identifier of a chip and is
used to track and manage information of the entire lifecycle (including chip manufacturing,
chip test, board processing, server test, and live network operation).
This command uses the PRP1, PRP2, Dword10, and Dword12 fields. Enter reserved value 0
for other fields that are not involved.
Table A-35 Sub_OpCode
Sub_OpCode
0x240009h
Issue 07 (2019-03-19)
Description
NOR patrol test
Firmware uncorrectable error test: four invalid firmware backups
System area test too many bad blocks in the NAND system area
Bad block test: too many bad blocks in the NAND data area
Controller test: invalid controller
Power down fast interrupt request (FIQ) test
Formatting failure test
Db poweron fail test
Reserved
Lbn miss happen test
Deep rebuild happen Test
Reserved
1: Firmware needs to be upgraded to restore SSDs.
1: Data loss risks exist.
1: SSDs can be restored, but risks exist.
1: SSDs can be restored.
1: Forcibly restore SSDs so that the SSDs can function properly.
1: Restart or power on and then off SSDs to restore SSDs.
1: The fault cannot be rectified. Contact Huawei support engineers.
Copyright © Huawei Technologies Co., Ltd.
A Supported NVMe Commands
Description
Obtain the chip DIEID.
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