Overview Of Single Test Analysis; Wiremap Test - IDEAL Networks LanTEK III Manual

6.5

Overview of Single Test Analysis

Analysis mode allows fault repair by performing single tests, making changes and
displaying changed test results. With the analysis test it is possible to check the cable
continuously for damage or overstretching.
Depending on cable type and specified test standard, the following single test analyses are
available:
Wiremap
Capacitance
ACR-N (ACR)
Delay and Skew
Margin
NOTE:
The following tests do not require a Remote handset (RH): Resistance, Length,
Capacitance, Impedance, Delay and Skew.
6.6

Wiremap Test

With the aid of Wiremap tests it is possible to pinpoint short circuits, interrupts and
incorrect wiring. To facilitate evaluation, the test results are displayed in graph format.
An error indicated by the Wiremap test should always be corrected first, since it will cause
errors in other tests. An unwired contact can cause the tests for DC loop resistance and loss
to receive a failing grade as well. An interrupt can also lead to a zero result when testing
capacitance, resulting in failed NEXT measuring values.
The Wiremap test ensures the following minimum thresholds for fault recognition (based on
four wire pairs, optional shield):
• All Wiremap errors or combined Wiremap errors are indicated as errors in the
Wiremap diagram.
• All combinations of up to three interrupts, short circuits or reversed connections are
correctly detected.
• In case of interrupts and short circuits, the cable end at which the error occurred is
indicated (on Autotest screen for length measurement).
LanTEK III
User Manual
Resistance
NEXT
Return loss
Power Sum NEXT
ACR-F (ELFEXT)
Fig. 72 Wiremap Test
Length
Loss/Insertion Loss
Impedance
Power Sum ACR-N (Power Sum ACR)
Power Sum ACR-F (Power Sum ELFEXT)
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