Internal Test Pattern Generator - Teledyne G3-GM10-M0641 User Manual

Internal Test Pattern Generator

The Genie Nano camera includes a number of internal test patterns which easily confirm camera
installations, without the need for a camera lens or proper lighting.
Use CamExpert to easily enable and select the any of the Nano test patterns from the drop menu
while the camera is not in acquisition mode. Select live grab to see the pattern output.
Note that internal test patterns are generated by the camera FPGA where the patterns are inserted
immediately after the sensor output in the processing chain and are the same maximum bit depth
as the sensor. The patterns are identical for monochrome or color camera models and subject to
processing operations.
Note: Selecting the camera 8-bit output format displays the lower 8-bits of the processing path.
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The Nano Test Patterns are:
Grey Horizontal ramp: Image is filled horizontally with an image that goes from the darkest
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possible value to the brightest.
Grey Vertical ramp: Image is filled vertically with an image that goes from the darkest
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possible value to the brightest.
Grey Diagonal Ramp Moving: combination of the 2 previous schemes, but first pixel in image
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is incremented by 1 between successive frames. This is a good pattern to indicate motion when
doing a continuous grab.
Important: When an internal Nano Test Image is selected, the
Time and Exposure Delay are not valid values and must be ignored.
Nano Series GigE Vision Camera
Metadata feature values for Exposure
Operational Reference
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