1MRK 511 366-UUS -
11.6.3.2
11.6.4
11.6.4.1
Commissioning manual
6.
Check that the PICKUP signal resets.
7.
Instantaneously decrease the frequency of the applied voltage to a value about 20%
lower than the nominal value.
8.
Measure the time delay for the TRIP signal, and compare it with the set value.
Extended testing
1.
The test above can be repeated to check a positive setting of PickupFreqGrad.
2.
The tests above can be repeated to check the time to reset.
3.
The tests above can be repeated to test the RESTORE signal, when the frequency
recovers from a low value.
Completing the test
Continue to test another function or end the test by changing the TestMode setting to
Disabled. Restore connections and settings to their original values, if they were changed
for testing purposes.
Frequency time accumulation protection function FTAQFVR
(81A)
Prepare the IED for verification of settings as outlined in section "Overview" and section
"Preparing for test" in this chapter.
Verifying the settings
Time measurement and the injection of current and voltage can be done using a common
test equipment.
Verification of the PICKUP value and time delay to trip
1.
Connect the test set for the injection of three-phase currents and three-phase voltages
to the appropriate current and voltage terminals of the IED.
2.
Ensure that the settings in the IED are appropriate, especially the
PickupCurrentLevel, FreqHighLimit, FreqLowLimit, VHighLimit and VLowLimit
setting.
3.
Supply the IED with three-phase currents and voltages at their rated value.
4.
Slowly decrease the frequency of the applied voltage until it crosses the frequency
high limit and the BFI_3P signal appears.
5.
Check that the FREQOK signal appears.
6.
Compare the trip value to the set frequency high limit value.
7.
Decrease the frequency of the applied voltage until it crosses the frequency low limit
and the BFI_3P signal disappears.
8.
Check that the FREQOK signal disappears.
Testing functionality by secondary injection
Section 11
143