Dasd Checkout; Host Built-In Self Test (Bist) Checkout; I2C Bus Fault Messages - IBM 866631Y - Netfinity 7100 - 8666 Hardware Maintenance Manual

DASD checkout

Host Built-In Self Test (BIST) checkout

I2C bus fault messages

Message
System shutoff due to DASD temperature
(sensor X) (level-critical; DASD area reported
temperature outside recommended operating
range)
System shutoff due to high ambient
temperature (level-critical; high ambient
temperature)
System shutoff due to system board under
temperature (level-critical; system board is under
temperature)
Message
Hard drive (SCSI ID "X") removal detected
(level-critical; hard drive "X" has been
removed)
Hard drive (SCSI ID "X") fault
Message
Host BIST fail (level-informational; host's
built-in self test failed)
Message
Failure reading I2C device. Check devices on
bus 0.
Failure reading I2C device. Check devices on
bus 1.
Failure reading I2C device. Check devices on
bus 2.
Action
1. Ensure system is being properly
cooled, see "Temperature checkout"
on page 20.
1. Ambient temperature must be
within normal operating
specifications(see "Features and
specifications" on page 3.
1. Ambient temperature must be
within normal operating
specifications(see "Features and
specifications" on page 3.
Action
1. Information only, take action as
appropriate.
1. Replace hard drive (SCSI ID "X").
Action
1. Reseat CPU
2. Reseat VRM
3. Replace CPU
Action
1. Replace I/O Legacy Board
1. Reseat I/O Legacy Board
2. Reseat power supplies
3. Replace power supply
4. Replace Power Backplane
5. Replace I/O Legacy Board
1. Reseat front panel connector
2. Reseat diagnostics panel connector
3. Reseat I/O Legacy Board
4. Replace front panel
5. Replace diagnostics panel
6. Replace Power Backplane
7. Replace I/O Legacy Board
Symptom-to-FRU index
141