Omron MicroHAWK V320-F User Manual page 372

 Cell Contrast Threshold
Usage:
Definition:
Serial Cmd:
Default:
Options:
 Cell Moduration
Usage:
Definition:
Serial Cmd:
Default:
Options:
 Cell Moduration Threshold
Usage:
Definition:
Serial Cmd:
Default:
Options:
 Fixed Pattern Damage
Usage:
Definition:
Serial Cmd:
Default:
Options:
MicroHAWK V320-F / V330-F / V420-F / V430-F Barcode Reader User Manual
Sets the threshold for driving the output.
Conforms to ISO/IEC 29158 symbol quality grading (A,B,C,D).
<K890, output on overall grade, overall grade threshold, cell contrast, cell
contrast threshold, cell modulation, cell modulation threshold, fixed pattern
damage, fixed pattern damage threshold, axial non-uniformity, axial non-
uniformity threshold, grid non-uniformity, grid non-uniformity threshold,
unused ECC, unused ECC threshold>
Grade B
0 = Grade D
1 = Grade C
2 = Grade B
3 = Grade A
Lets the user know if symbol quality is less than acceptable.
If enabled, drives Output if grade is under Cell Moduration Threshold.
<K890, output on overall grade, overall grade threshold, cell contrast, cell
contrast threshold, cell modulation, cell modulation threshold, fixed pattern
damage, fixed pattern damage threshold, axial non-uniformity, axial non-
uniformity threshold, grid non-uniformity, grid non-uniformity threshold,
unused ECC, unused ECC threshold>
Disabled
0 = Disabled
Sets the threshold for driving the output.
Conforms to ISO/IEC 29158 symbol quality grading (A,B,C,D).
<K890, output on overall grade, overall grade threshold, cell contrast, cell
contrast threshold, cell modulation, cell modulation threshold, fixed pattern
damage, fixed pattern damage threshold, axial non-uniformity, axial non-
uniformity threshold, grid non-uniformity, grid non-uniformity threshold,
unused ECC, unused ECC threshold>
Grade B
0 = Grade D
1 = Grade C
2 = Grade B
3 = Grade A
Lets the user know if symbol quality is less than acceptable.
If enabled, drives Output if grade is under Fixed Pattern Damage
Threshold.
<K890, output on overall grade, overall grade threshold, cell contrast, cell
contrast threshold, cell modulation, cell modulation threshold, fixed pattern
damage, fixed pattern damage threshold, axial non-uniformity, axial non-
uniformity threshold, grid non-uniformity, grid non-uniformity threshold,
unused ECC, unused ECC threshold>
Disabled
0 = Disabled
1 = Enabled
1 = Enabled
Appendices
H
H-35