Features Register Values (Subcommands) And Functions - Fujitsu MPG3xxxAT Product Manual

Table 5.8 Features Register values (subcommands) and functions (1/2)
Features Resister
X'D0' SMART Read Attribute Values:
A device that received this subcommand asserts the BSY bit and saves all the
updated attribute values. The device then clears the BSY bit and transfers 512-byte
attribute value information to the host.
* For information about the format of the attribute value information, see Table 5.9.
X'D1' SMART Read Attribute Thresholds:
This subcommand is used to transfer 512-byte insurance failure threshold value data
to the host.
* For information about the format of the insurance failure threshold value data, see
Table 5.10.
X'D2' SMART Enable-Disable Attribute AutoSave:
This subcommand is used to enable (SC register
00h) the setting of the automatic saving feature for the device attribute data. The
setting is maintained every time the device is turned off and then on. When the
automatic saving feature is enabled, the attribute values are saved after 15 minutes
passed since the previous saving of the attribute values. However, if the failure
prediction feature is disabled, the attribute values are not automatically saved.
When the device receives this subcommand, it asserts the BSY bit, enables or
disables the automatic saving feature, then clears the BSY bit.
X'D3' SMART Save Attribute Values:
When the device receives this subcommand, it asserts the BSY bit, saves device
attribute value data, then clears the BSY bit.
X'D4' SMART Execute off-line Immediate/Execute Self Test:
The device that received these subcommands shall execute off-line data collection or
Self Test, or device shall abort current Self Test.
The setting of SN register is described as following.
The device that received subcommand (SN register is described 00h, 01h or 02h)
shall execute Off-line data collection or Self Test after asserts the BSY bit and clears
it.
The device that received subcommand (SN register is described 81h or 82h) shall
execute Self Test after assert the BSY bit, then clears the BSY bit after completes
these command process.
The device that received subcommand (SN register is described 7Fh) shall assert the
BSY bit. When the device is in process of performing Self Test or off-line data
collection, it should abort the current Self Test or off-line data collection, then clears
the BSY bit.
Off-line data collection:
Self Test functions:
- Quick Test – Off-line Mode
- Quick Test – Captive Mode
- Comprehensive Test – Off-line Mode
- Comprehensive Test – Captive Mode
- Self Test Stop
C141-E110-02EN
Function
00h) or disable (SC register =
(SN register = 00h)
(SN register = 01h)
(SN register = 81h)
(SN register = 02h)
(SN register = 82h)
(SN register = 7Fh)
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