HP 1660 Series Service Manual page 30

3
To perform the self-tests 3-3
To make the test connectors ( logic analyzer) 3-6
To test the threshold accuracy ( logic analyzer) 3-8
To test the glitch capture ( logic analyzer) 3-17
To test the single-clock, single-edge, state acquisition ( logic analyzer) 3-23
To test the multiple-clock, multiple-edge, state acquisition ( logic analyzer) 3-35
To test the single-clock, multiple-edge, state acquisition ( logic analyzer) 3-47
To test the time interval accuracy ( logic analyzer) 3-59
To test the CAL OUTPUT ports ( oscilloscope) 3-64
To test the input resistance ( oscilloscope) 3-68
Perform an operational accuracy calibration 3-71
To test the voltage measurement accuracy ( oscilloscope) 3-72
To test the offset accuracy ( oscilloscope) 3-76
To test the bandwidth ( oscilloscope) 3-81
To test the time measurement accuracy ( oscilloscope) 3-86
To test the trigger sensitivity ( oscilloscope) 3-90
Performance Test Record ( logic analyzer) 3-94
Performance Test Record ( oscilloscope) 3-101
Testing Performance