Performing Diagnostic Applications; Emu0/1 Configuration Without Global Stop - Texas Instruments TMS320C6000 Reference Manual

Dsp designing for jtag emulation
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Emulation Design Considerations
If having devices on one target board stopped by devices on another target
board via the EMU0/1 signals is not important, then the circuit in Figure 12 can
be used. In this configuration, the global-stop capability is lost. It is important
not to overload EMU0/1 with more than 16 devices.
Figure 12.

EMU0/1 Configuration Without Global Stop

Pullup Resistor
To Emulator
EMU0/1
Note:
The open-collector driver and pullup resistor on EMU1 must be able to provide rising/falling edges of less than 25 ns.
Rising edges slower than 25 ns can cause the emulator to detect false edges during the RUNB command or when the
external counter selected from the debugger analysis menu is used. If this condition cannot be met, then the EMU0/1
signals from the individual boards should be ANDed together (as shown in Figure 10 ) to produce an EMU0/1 signal for
the emulator.
9.4

Performing Diagnostic Applications

For systems that require built-in diagnostics, it is possible to connect the
emulation scan path directly to a TI ACT8990 test bus controller (TBC) instead
of the emulation header. The TBC is described in the Texas Instruments
Advanced Logic and Bus Interface Logic Data Book (literature number
SCYD001). Figure 13 shows the scan path connections of n devices to the
TBC.
24
Designing for JTAG Emulation
Pullup Resistor
. . .
EMU0/1
Device
Device
. . .
1
n
Target Board 1
Target Board m
Pullup Resistor
. . .
EMU0/1
Device
Device
. . .
1
n
SPRU641

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