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5 .
I f you are entering from the keyboard , type lF and press the Fl key
and the F l O key .
assembly, press the 1 and F keypads and press the TEST NUM and EXEC
so ftkeys .
6 .
Observe whether the test is passed (OK) or FAILED . I f the test fails ,
replace the planar board .
Disconnect the wrap cable ins t a l l ed in Step 1 .
7 .
3 . 1 2 . 2
S E R I A L PORTS 01 A N D 02 TEST - - TEST 1 0
Test lD checks serial port 0 1 with serial port 0 2 and requires the at
tachment o f the wrap cable labeled TEST lD lE lF .
a malfunction in port 0 1 and/or port 02 .
should be replaced.
To conduct test lD :
1 .
Connect the TEST 1D 1E lF wrap cable to ports 0 1 and 02 on the
processor unit back plate .
2 .
C a l l for test 1D .
E cho Test - - Test 1 9 . "
3 .
After you receive the "CONNECT SERIAL WRAP CABLE TO PORTS
message , press the FlO key or EXEC softkey.
4 .
Observe whether the test is passed (OK) or FAILED .
fails , replace the p l anar board .
the wrap cab l e installed in Step
5 .
Disconnect
3 . 1 2 . 3
I EEE-488 B U S PORT
TEST l C
Test l C checks the IEEE - 488 BUS port 0 0 with the Paral lel PPU port and
requires the insta l lation o f the wrap cable labeled IEEE/USER PORT WRAP
TEST #lC .
A fai led test indicates a malfunction in the PPU port and/or
the IEEE port .
In either cas e , the p lanar board should be replaced .
To conduct test l C :
Optional Diagnost i c , Voltage, and Resis tance Checks 3 - 2 2
If
you are entering from the keypad and softkey
In either cas e , the planar board
in
Section 3 . 7 . 1 , "Keypad and Softkey
See notes
00
A N D PARALLEL PPU PORT TEST
A failed test indicates
&
1
I f the test
1 .
2"
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