Metallic Access Unit Testing Capabilities; Introduction; Initiating Mtau Test Access; Conn-Jack-T1 - ADTRAN H2TU-C Installation And Maintenance Practice

Asynchrononous line cards for litespan channel bank assemblies using narrowband and wideband pairs
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Metallic Access Unit Testing Capabilities

INTRODUCTION

This appendix describes the testing functionality available for the Litespan H2TU-C via the
MTAU unit. For a complete description of the MTAU unit, refer to Alcatel document Common
Equipment Unit Descriptions, OSP 363-405-250.
The functionality of the SPLIT and MON features detailed in this
document supersedes that shown in the OSP 363-405-250.

INITIATING MTAU TEST ACCESS

CONN-JACK-T1

The Connect T1 Jack command connects a T1 or HDSL facility to the MTAU via the channel
bank test bus.
Input Format:
CONN-JACK-T1:<TID>:<AID>:<CTAG>::<MD>;
AID = Access ID of the unit to be connected to the MTAU
MD = Mode (SPLIT or MON)
Example: CONN-JACK-T1::COT-1-15:::SPLIT;
To use SPLIT mode, a facility must be out of service for mainte-
nance or out of service for memory administration.
61221002L1-5F
Appendix C
NOTE
NOTE
C-1

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