Run Self-Test - ADTRAN TSU 120 User Manual

Press
the test pattern is set to
Using TST DS0s for testing can be very useful, particularly in
Fractional T1 applications. You can run an end-to-end test on
the Fractional DS0s by:
1. Setting for Map B the TST in the same DS0 as used by Map
2. Looping the far end using a V.54 loopback code on the Nx/
In addition, a single DS0 can be used for continuous testing
while other DS0s are passing normal data. This will also pro-
vide an end-to-end check on the entire link. Set each end to
send QRSS in TST DS0s (using 1 DS0) and occasionally view
the results on the

Run Self-test

The self-test checks the integrity of the internal operation of the
electronic components by performing memory tests and by
sending and verifying data test patterns through all internal
interfaces. Although actual user data cannot be passed during
these tests, the self-test can be run with the network and DTE
interfaces in place and will not disturb any external interface.
The memory portion of the self-test automatically executes
upon power-up. A full self-test can be commanded from a front
panel menu or from T-WATCH Pro.
In addition to the specified self-tests, background tests are also
run on various parts of the internal electronics. These run dur-
ing normal operation to confirm continued correct functioning.
This menu selection is used to execute a full internal self-test.
The results of the self-tests are displayed in the LCD. Upon
invoking the command, the LCD displays
and the test LEDs are illuminated. Test failures are displayed in
the LCD window.
61202129L1-1
to clear results. The results are accumulated until
Shift+9
A to receive data from an Nx/DBU port, and
DBU port (DBU is TSU 120e only).
PATTERN RESULT
TSU 120 User Manual
or .
N C
ONE LEARED
menu selection.
Chapter 7. Test Menu
S S -
YSTEM ELF TEST
7-7