Measuring Polarization Dependent Loss - JDS Uniphase SWS15100 User Manual

Swept wavelength systems
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Measuring Polarization Dependent Loss

PDL through a device can be measured using the SWS, using the optional four-state
polarization controller (SWS15104). The PDL can be measured for any passive device for
insertion losses between 0 and 40 dB. The specifications for PDL measurement are given the
Specifications section.
PDL measurements in the SWS are made using the Mueller matrix method. The details and
theory of measurement are found in the SWS15104 Four-State Polarization Controller User's
Manual (document SD000327).
Other useful parameters are also calculated with the PDL measurement. The parameters are
the minimum IL over all polarization states, the maximum IL over all polarization states, and the
average IL. All are available at the same wavelength resolution as IL measurements.
To perform PDL measurements:
1. Set up the device as if for IL measurements and follow the instructions in the Using SWS
Software section.
2. Set the SOM to polarization mode 1, as explained in the Setting Source Optics Module
Parameters section.
3. Connect the four-state polarization controller as explained in the Four-State Polarization
Controller User's Manual.
4. Select PDL in the Mode menu of the software.
5. Select the channels to process.
6. Perform a zero loss reference scan for each of the selected channels.
7. Connect the device.
8. Select the types of traces to be displayed from average IL, minimum IL, maximum IL, and
PDL. Select any two types for display at one time. The first display uses the primary y-axis
on the left, while the second uses the secondary y-axis on the right.
9. In the SWS application, select the type of analysis.
10. Acquire a trace.
When a PDL measurement is complete, the selected traces are displayed. To change the types
of trace displayed without re-acquiring new data, de-select the unwanted traces, select the new
ones, and refresh the display.
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Operating and Maintenance Instructions – 93

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