Mitsubishi Electric MELSEC iQ-R Series User Manual page 60

Section 5 BUFFER MEMORY
Table 5.1-4 Waveform data sections (Un\G10000 to Un\G22013) (2/2)
Address
Item
(Decimal)
Current 16000 Multiplying factor of current waveform data
waveform
16001 Number of the waveform data of current
data
16002 Communication error flag
16003 System area
16004
Phase 1 current waveform data 1
16005
16006
Phase 1 current waveform data 2
16007
16602
Phase 1 current waveform data 300
16603
16604
System area
20003
20004
Phase 3 current waveform data 1
20005
20006
Phase 3 current waveform data 2
20007
20602
Phase 3 current waveform data 300
20603
20604
System area
21999
Voltage 22000 Multiplying factor of voltage and current waveform data
and current
22001 Communication error flag
continuous
22002
1-2 voltage waveform data
waveform
22003
data
22004
2-3 voltage waveform data
22005
22006
System area
22007
22008
Phase 1 current waveform data
22009
22010
System area
22011
22012
Phase 3 current waveform data
22013
*1: Even if the power failure is restored, data is held because data is backed up by the nonvolatile memory.
*2: For the procedure for using the test mode, refer to "3.4.5".
*3: Storage addresses for each 300 waveform data are allocated to the buffer memory. Practically, waveform
data being sampled during period of measured data acquisition clock is stored, 0 is stored to the remaining
address.
Description
*3
*3
・ ・
・
*3
*3
*3
・ ・
・
*3
59
Default Back
R/W
value up
*1
-3 R -
0 R -
0 R -
- - -
0 R -
0 R -
0 R -
- - -
0 R -
0 R -
0 R -
- - -
-3 R -
0 R -
0 R -
0 R -
- - -
0 R -
- - -
0 R -
RE81WH
Output value
during the test
mode *2
-3
40
0
-
3001
3002
3998
-
5001
5002
5998
-
-3
0
1
2
-
4
-
6