ST STM32F103x6 Manual page 29

STM32F103xx
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with SAE J
1752/3 standard which specifies the test board and the pin loading.
Table 26.
Symbol Parameter
S
EMI
EMI characteristics
Conditions
= 3.3 V, T
V
DD
LQFP100 package
Peak level
compliant with SAE J
1752/3
Monitored
Frequency Band
0.1 to 30 MHz
= 2 5 °C,
A
30 to 130 MHz
130 MHz to 1GHz
SAE EMI Level
Electrical characteristics
Max vs. [f /f ]
HSE HCLK
8/48 MHz 8/72 MHz
12 12
22 19 dBµV
23 29
4 4
Unit
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