Fluke 917X Series Technical Manual page 53

Controller operation
Main Menu
TEST
The TEST parameter requires the user to select the test to be programmed. Select one
of the four tests to configure and press "ENTER".
LOW TEMP
The LOW TEMP parameter is the temperature at which the Metrology Well heats or
cools, in order to begin testing if the test is just starting or the temperature at which the
instrument begins to heat to start a cycle.
HIGH TEMP
The HIGH TEMP parameter is the temperature during a cycle at which the Metrology
Well begins to cool at the rate specified in "Ramp Rate".
APPROACH
The APPROACH parameter determines when the system scan rate is used and when
the switch test ramp rate is used to limit scan rate. During the test, the controller uses
the system scan rate until the temperature is within the approach temperature of either
the high temp or low temp parameters.
RAMP RATE
The RAMP RATE parameter is the rate at which the instrument heats or cools once the
low or high limit is reached. The ramp rate affects the accuracy with which the open-
ing/closing of a thermal switch may be measured. The ramp rate should be selected by
the user such that the opening/closing of the switch can accurately be measured.
CYCLES
The CYCLES parameter determines how many times the instrument heats and cools
allowing a thermal switch or batch of switches to be tested.
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