Reflect In Total Judgment; Changing Edge Detection Conditions (Sensors With Monochrome Cameras Only) - Omron FQ2-S/CH Series User Manual

Reflect in Total Judgment

You can specify whether to reflect the judgment results of an inspection item in the overall judgment.
The Default is to reflect them.
[Inspect] − [Inspection]
[Output parameter]

Changing Edge Detection Conditions (Sensors with Monochrome Cameras Only)

You can change the following measurement conditions for Sensors with Monochrome Cameras.
[Inspect] − [Inspection] − [Edge Position] − [Modify] − [Details] Tab Page − [Meas. Parameter]
Item
Measurement methods
Density change
(when Measurement methods
is set to Projection only)
FQ2-S/CH User's Manual
− [Add item.] − [Edge Position]
Parameter
A projection is formed based on the gray level, and any position of inter-
section between the gray level value and the threshold (edge level) is
Projection detected as an edge.
This detection method is used when you must process an image with
excessive noise or when the edges are blurry.
A differentiated waveform is created that represents the amount of
change in gray level between neighboring pixels.
Differentiation The maximum value of the differentiated waveform that exceeds the
threshold (edge level) is detected as an edge.
This detection method is used for low-contrast images.
Light to Dark Detects as an edge any position within the specified region that changes
from white to black.
Dark to Light Detects as an edge any position within the specified region that changes
from black to white.
Inspecting with the Edge Position Inspection Item
− [Details] Tab Page −
Description
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