Sorting Extracted Labels; Reflect In Total Judgement - Omron FQ2-S/CH Series User Manual

Sorting Extracted Labels

Set the sort condition and count for extracted labels. You can set the sort condition and the maximum number
of detections for detection results.
[Inspect] − [Inspection] −
1
Press [Sorting method].
2
Select the sorting method.
Parameter
Area ascending order
Area descending order (Default)
Pos. X ascending order
(ascending order of X coordinate)
Sorting Pos. X descending order
method (descending order of X coordinate)
Pos. Y ascending order
(ascending order of Y coordinate)
Pos. Y descending order
(descending order of Y coordinate)

Reflect in Total Judgement

You can specify whether to reflect the judgment results of an inspection item in the overall judgment.
The Default is to reflect them.
[Inspect] [Inspection]
−
FQ2-S/CH User's Manual
[Labeling] − [Modify] −
Setting
[Add item.] [Labeling]
− −
[Details] Tab Page − [Meas. Parameter]
Description
Set the condition to use for label number
reassignment. When sorting by X or Y coor-
dinates, the upperleft corner is the origin.
[Details] Tab Page
− −
Inspecting with the Labeling Inspection Item
[Output parameter]
319