Diagnostics; Generating A Test Pattern - Teledyne DALSA HS-40-04k40-xx-R User Manual

High sensitivity line scan ccd camera
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Piranha HS-xx RoHS User Manual

4.7 Diagnostics

4.7.1 Generating a Test Pattern

Purpose:
Syntax:
Syntax Elem ents:
N otes:
Exam ple:
Table 19: 4k Test Patterns
4k Camera
Operating
Mode
TDI Mod e
Forw ard ,
smm 0, svm
1
TDI Mod e
Reverse, smm
0, svm 1
TDI Mod e
Forw ard ,
smm 1, svm
1
TDI Mod e
Reverse, smm
1, svm 1
Area Mod e
Forw ard ,
smm 0, svm
1
Teledyne DALSA
Generates a test pattern to aid in system d ebugging. The test
patterns are useful for verifying proper tim ing and connections
betw een the cam era and the fram e grabber. The follow ing tables
show each available test pattern.
svm i
i
0 Vid eo.
1 12 bit test pattern 1 (ram p)
2 8 bit test pattern 2 (step)
When returning to vid eo (svm 0) after view ing a test pattern,
the cam era restores the saved user settings for d igital offset
(sdo), enable pixel coefficients (epc), set subtract background
(ssb), and set system d igital gain (ssg).
The follow ing d iagram s show 12-bit pixel values. When
operating in 8-bit m od e, pixel values w ill be 1/ 16
values in the d iagram .
svm 2
Test Pattern
73
th
of pixel
03-032-20013-03

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