Data Retention and Endurance
Parameter
DATA
Data Retention at 55°C
R
NV
Nonvolatile STORE Operations
C
Capacitance
In the following table, the capacitance parameters are listed.
Parameter
Description
C
Input Capacitance
IN
C
Output Capacitance
OUT
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Parameter
Description
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)
3.0V
Output
30 pF
AC Test Conditions
Input Pulse Levels .................................................... 0V to 3V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .................... 1.5V
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: 001-06400 Rev. *I
Description
[6]
Test Conditions
T
= 25°C, f = 1 MHz,
A
V
= 0 to 3.0V
CC
Test Conditions
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
Figure 4. AC Test Loads
R1 577Ω
R2
789Ω
[6]
3.0V
Output
5 pF
CY14B101L
Min
Unit
20
Years
200
K
Max
Unit
7
pF
7
pF
32-SOIC
48-SSOP
Unit
°C/W
33.64
32.9
°C/W
13.6
16.35
For Tri-state Specs
R1 577Ω
R2
789Ω
Page 8 of 18
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