5. Cabling: Test Access SIM
Using the Test Access Path (TAP) Ports
The Test Access SIM provides input and output Test Access Path (TAP) ports.
These are used in conjunction with Transaction Language 1 (TL1) commands for
testing of cards (such as the 8922 POTS card) that support a Metallic Test Access
Unit (MTAU) function.
See the 8620 and 8820 Broadband Access Concentrators TL1 Interface
Reference for more information.
Hot Insertion or Removal of the SIM
If the port-card Ethernet interfaces are not being used, it is possible to remove the
SIM without disrupting user data. However, if the user terminal (console) or
10BaseT management interface is connected, the management interface of the
BAC will be interrupted. Also, the MAC addresses of the management interfaces
will be redefined by the new SIM.
The SCP card must be reset when the SIM is removed or inserted.
5-8
November 2004
8820-A2-GN20-80