Toshiba GR200 Series Instruction Manual page 92

Line differential protection ied

Hide thumbs Also See for GR200 Series:

Table of Contents

From PROT-COMM

DIFL-STUB-Test†

Figure 2.6-11 STUB logic furnished in the local IED

†Note: For testing the stub protection, set On for scheme switch [DIFL-STUB-Test];

consequently, the user can examine the function regardless of the DS condition.

‡Note: The trip circuit (TRC) is discussed separately. See Chapter

§Note: The DIFL#2 element is only available in the [TERM_TOPOLOGY]=2Term-Dual.

DIFL operation at terminal-H

On the other hand, the current data received from the opposite terminal is set to be zero when

the opposite terminal does not operate. That is, the IED_H gets to sense the operation of the

terminal G; the operation of the opposite can be sensed by using open terminal detection

function†. Consequently, the DIFL function does not need to have a respace for a fault such

that it is illustrated Figure 2.6-12.

Figure 2.6-12 Fault occurred beyond Stub zone

†Note: On should be set for the [OTD] for the operation. For more information, see the

. Note that the trip signal generated opens the three-poles.

Relay application: Communication application

6F2S1914 (0.49)

DIFL-STUB-COND

Relay application: Trip

GRL200 (Soft 033 & 037)

Chapters

Table of Contents