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SECTION I
Model 4277A
Table 1-3. Accessories Available (Sheet 1 of 3)
16047A
(furnished)
Test
Fixture
(direct
attachment
type)
for
measurement
of
either
axial-or
radial-lead
components. Three kinds of contact inserts are
furnished:
(I)
For axial-lead components,
(HP P/N: 16061-70022)
@ For general radial-lead components,
(HP P/N: 16061-70021)
(D
For radial short-lead components,
(HP P/N; 16047-65001)
DC bias up to ±40V* can be applied.
16047C
Test Fixture (direct attachment type) designed
especially
for
high
frequency
measurements
requiring
high
accuracy.
Two
screw
knobs
facilitate and ensure optimum contact between
the test fixture electrodes and the sample leads.
DC bias up to ±40V* can be applied.
Test Fixture (tweezer type) for measurement of
miniature
leadless
components
such
as chip
capacitors.
Employs
a
three
terminal
configuration tweezer probe suitable for high
impedance (above 50fl) measurements.
DC bias up to ±40V* can be applied.
Cable length; Im
1-24
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