Keithley S530 Diagnostic Manual page 45

S530 Diagnostic Manual
The basic short test is looped until all SMUs are tested. Adjacent pairs of rows (for example, row k
and row k+1 where k = 1, 3, 5*) will be used during this test. The pair of rows will be tested in reverse
order once to test the paths opposite direction. For example, the row A and B test path will change to
row B and A.
Figure 42: Basic short test
Basic short force test
During the short test, SMUs are used in the 2W mode. The test flow is the same as the instrument
card 2W tests..
Basic short sense test
During the short test, SMUs are used in 4W mode.

Use pin 1 to connect the force and sense terminals of the current SMU under test to rows (A, C,
or E).

Use pin 2 to connect the force and sense terminals of the test support SMU to rows (B, D, or F).

Use pin 3 to connect the force and sense terminals to the common lo (GNDU) using rows C or F.
If the current row pair is (C, D), then connect GNDU and pin 3 to row F. If the current row pair is
(A, B), (E, F), then connect GNDU is connected to pin 3 through row C.
S530-906-01 Rev. A / March 2011
Appendix B: Kelvin (4W) S530 system diagnostics
NOTE
3-7