Grading And Binning Resistors; Introduction - Tektronix Keithley DMM7510 User Manual

In this section:

Introduction

This application example demonstrates how to use the DMM7510 to perform benchtop binning
operations. It uses the trigger model and digital I/O to control external component-handling devices.
The DMM7510 can do simple pass-or-fail testing and grading and sorting. Grading resistors is a
common application that is done by monitoring multiple limits until the first failure is received. Binning
resistors is also common but unlike grading, involves monitoring limits until the first pass is received.
To prevent electric shock, test connections must be configured such that the user cannot
come in contact with test leads or any device under test (DUT) that is in contact with the
conductors. It is good practice to disconnect power before connecting DUTs. Safe installation
requires proper shields, barriers, and grounding to prevent contact with test leads.
There is no internal connection between protective earth (safety ground) and the LO
terminals of the DMM7510. Therefore, hazardous voltages (more than 30 V
LO terminals. This can occur when the instrument is operating in any mode. To prevent
hazardous voltage from appearing on the LO terminals, connect the LO terminal to protective
earth (safety ground) if your application allows it. You can connect the LO terminal to the
chassis ground terminal on the front panel or the chassis ground screw terminal on the rear
panel. Note that the front-panel terminals are isolated from the rear-panel terminals.
Therefore, if you are using the front-panel terminals, ground to the front-panel LO terminal. If
using the rear-panel terminals, ground to the rear-panel LO terminal. Failure to follow these
guidelines can result in injury, death, or instrument damage. Failure to recognize and observe
normal safety precautions could result in personal injury or death.
Introduction ............................................................................... 8-1
Instrument connections ............................................................ 8-2
Resistor grading and binning test ............................................. 8-2

Grading and binning resistors

Section 8
) can appear on
RMS