Application Library; Oscilloscope View - Keysight Technologies B1500A Configuration And Connection Manual

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Application library

Contains over 300 application test definitions conveniently organized by device
type, application, and technology. You can easily edit and customize the furnished
application tests to fit your specific needs.
The following table shows a part of tests included in the library. They are subject to
change without notice.
Table 1-27 Application library, Category list
Category
CMOS
BJT
Discrete
Memory
Power Device
NanoTech
Reliability

Oscilloscope view

Available for the tracer test using MCSMU modules. The oscilloscope view displays
MCSMU current or voltage measurement data versus time. The pulsed measurement
waveforms appear in a separate window for easy verification of the measurement timings.
This function is useful for verifying waveform timings and debugging pulsed
measurements. It is available when a tracer test has one or more MCSMU channels being
used in pulsed mode. The oscilloscope view can display the pulse waveform at any (user
specified) sweep step of the sweep output.
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Keysight B1500A Configuration and Connection Guide
result (tracing the I-V curve). Range of the sweep output and measurement can be
changed by the rotary knob on the front panel. Test setups can be saved, and used in the
classic test mode for further detailed measurement and analysis. Also see
"Oscilloscope view".
Quick test mode - A GUI-based quick test mode enables you to perform test
sequencing without programming. You can select, copy, rearrange, and cut-and-paste
any test setups with a few simple mouse clicks. Once you have selected and arranged
your tests, simply click on the measurement button to begin running an automated test
sequence.
Id-Vg, Id-Vd, Vth, breakdown, capacitance, QSCV, etc.
Ic-Vc, diode, Gummel plot, breakdown, hfe, capacitance, etc.
Id-Vg, Id-Vd, Ic-Vc, diode, etc.
Vth, capacitance, endurance test, etc.
Pulsed Id-Vg, pulsed Id-Vd, breakdown, etc.
Resistance, Id-Vg, Id-Vd, Ic-Vc, etc.
NBTI/PBTI, charge pumping, electromigration, hot carrier injection, J-Ramp, TDDB, etc.
Sampling interval: 2 μs
Sampling points: 2000 Sa
Sampling duration: 22 μs to 24 ms
Data saving
Numeric: TXT/CSV/XMLSS
Image: EMF/BMP/JPG/PNG
B1500A Product Configuration
EasyEXPERT group+ software
Test items
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