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Agilent Technologies 16900 Series Service Manual

Logic analyzer modules
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Advanced Test Equipment Rentals
www.atecorp.com 800-404-ATEC (2832)
Service Guide
Publication number 16910-97000
April 2004
For Safety and Regulatory information, see the pages at the end of the book.
© Copyright Agilent Technologies 2001-2004
All Rights Reserved.
Agilent Technologies
16910/11A Logic Analyzers

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  • Page 1 Advanced Test Equipment Rentals www.atecorp.com 800-404-ATEC (2832) Service Guide Publication number 16910-97000 April 2004 For Safety and Regulatory information, see the pages at the end of the book. © Copyright Agilent Technologies 2001-2004 All Rights Reserved. Agilent Technologies 16910/11A Logic Analyzers...
  • Page 2 Chapter : The Agilent 16910/11A Logic Analyzers—At a Glance The Agilent Technologies 16910A and 16911A are logic analyzer modules for the Agilent Technologies 16900-series logic analysis system. The 16910/11A offers high performance measurement capability. Features Some of the main features of the 16910/11A are as follows: •...
  • Page 3 Chapter : The 16910A Logic Analyzer The 16911A Logic Analyzer...
  • Page 4 In This Book This book is the service guide for the 16910A and 16911A logic analyzer modules. This service guide has eight chapters. Chapter 1, “General Information,” beginning on page 9 contains information about the module and includes accessories for the module, specifications and characteristics of the module, and a list of the equipment required for servicing the module.

  • Page 5: Table Of Contents

    Contents 1 General Information Accessories 10 Mainframe and Operating System 10 Specifications 11 Environmental Characteristics 12 Recommended Test Equipment 13 2 Preparing for Use Power Requirements 16 Operating Environment 16 Storage 16 To inspect the module 16 To configure and install the module 17 To test the module 17 To clean the module 17 3 Testing Logic Analyzer Performance...
  • Page 6 Contents Test Pod 1 in 250 Mb/s Mode 47 Determine PASS/FAIL (1 of 2 tests) 47 Close the Eye Finder and Analyzer Setup Windows 47 Configure the markers 47 Determine PASS/FAIL (2 of 2 tests) 49 Test the complement of the bits (250 Mb/s mode) 50 Test Pod 2 in 250 Mb/s Mode 52 Test the complement of the bits (Pod 2, 250 Mb/s mode) 53 Test the Remaining Pods in 250 Mb/s Mode 54...
  • Page 7 Contents 6 Replacing Assemblies Tools Required 84 To remove the module 84 To remove the logic analyzer cable 85 To install the logic analyzer cable 86 To replace the circuit board 87 To return assemblies 88 7 Replaceable Parts Ordering Replaceable Parts 90 Replaceable Parts List 91 16910A Exploded View 94 16911A Exploded View 95...
  • Page 8 Contents...

  • Page 9: General Information

    General Information This chapter lists the accessories, some of the specifications and characteristics, and the recommended test equipment.

  • Page 10: Accessories

    Single-Ended Probe, No Isolation Networks ( E5351A MICTOR Mainframe and Operating System The 16910/11A logic analyzers require an Agilent Technologies 16900-series logic analysis system (mainframe). The 16910/11A logic analyzers (module) will work with any version of the 16900-series logic analysis system operating system.

  • Page 11: Specifications

    Chapter 1: General Information Specifications The specifications are the performance standards against which the product is tested. tWidth (Data Eye) Individual vHeight Data Channel Sampling vThreshold Position (Eye Finder Blue Bar) 16753b01.vsd Specifications 250 Mb/s 500 Mb/s Parameter Notes mode mode Minimum master to 500 Mb/s mode is available only when...

  • Page 12: Environmental Characteristics

    Chapter 1: General Information Environmental Characteristics Probes Maximum Input Voltage ± 40 V, CAT I, CAT I = Category I, secondary power line isolated circuits. Operating Environment Temperature 0 to 40 °C (+32 °F to 104 °F) when operating in a 16900A or 16902A mainframe.

  • Page 13: Recommended Test Equipment

    Chapter 1: General Information Recommended Test Equipment Recommended Test Equipment Recommended Agilent Equipment Critical Specifications Use† Model/Part Single-ended Flying Lead no substitute E5383A P , T Probe Set (Qty 2) Ground Leads (Qty 5) no substitute pkg of 5 (Included with E5383A Probe Set) Pulse Generator 260 MHz,1 ns pulse width, two channels,...
  • Page 14 Chapter 1: General Information...

  • Page 15: Preparing For Use

    Preparing for Use This chapter gives you instructions for preparing the logic analyzer module for use.

  • Page 16: Power Requirements

    Chapter 2: Preparing for Use Power Requirements All power supplies required for operating the logic analyzer are supplied through the backplane connector in the mainframe. Operating Environment The operating environment is listed on page 12. Note the non-condensing humidity limitation. Condensation within the instrument can cause poor operation or malfunction.

  • Page 17: To Configure And Install The Module

    If you find any defects, contact your nearest Agilent Technologies Sales Office. Arrangements for repair or replacement are made, at Agilent Technologies' option, without waiting for a claim settlement. To configure and install the module Instructions for configuring and installing the module into the mainframe can be found in the installation guide for the mainframe.
  • Page 18 Chapter 2: Preparing for Use...

  • Page 19: Testing Logic Analyzer Performance

    Testing Logic Analyzer Performance This chapter tells you how to test the performance of the 16910A or 16911A logic analyzer against the specifications listed on page 11.
  • Page 20 “Pass” status for each of the tests. Test Strategy This chapter describes the module being tested in an Agilent Technologies 16900A-series mainframe. Only specified parameters are tested. Specifications are listed on page 11. The test conditions defined in this procedure ensure that the specified parameter is as good as or better than specification.
  • Page 21 Chapter 3: Testing Logic Analyzer Performance Test Equipment Each procedure lists the recommended test equipment. You can use equipment that satisfies the specifications given. However, the procedures are based on using the recommended model or part number. Instrument Warm-Up Before testing the performance of the module, warm-up the logic analyzer and the test equipment for 30 minutes.

  • Page 22: To Assemble The Sma/Flying Lead Test Connectors

    Chapter 3: Testing Logic Analyzer Performance To Assemble the SMA/Flying Lead Test Connectors To Assemble the SMA/Flying Lead Test Connectors The SMA/Flying Lead test connectors provide a high-bandwidth connection between the logic analyzer and the test equipment. The following procedure explains how to fabricate the required test connectors.
  • Page 23 Chapter 3: Testing Logic Analyzer Performance To Assemble the SMA/Flying Lead Test Connectors b Trim about 1.5 mm from the pin strip inner leads and straighten them so that they touch the outer leads. c Trim about 2.5 mm from the outer leads. solder d Using a very small amount of solder, tack each inner lead to each outer lead at the point where they are touching.
  • Page 24 Chapter 3: Testing Logic Analyzer Performance To Assemble the SMA/Flying Lead Test Connectors 2 Solder the pin strip to the SMA board mount connector: a Solder the leads on the left side of the pin strip to the center conductor of the SMA connector as shown in the diagram below.
  • Page 25 Chapter 3: Testing Logic Analyzer Performance To Assemble the SMA/Flying Lead Test Connectors c Rotate the assembly 180 degrees and solder the two SMA board mount connector frames together. 4 Check your work: a Ensure that the following four points have continuity between them: The two pins on the left side of the pin strip, and the center conductors of each SMA connector.
  • Page 26 Chapter 3: Testing Logic Analyzer Performance To Assemble the SMA/Flying Lead Test Connectors c The finished test connector is shown in the pictures below.

  • Page 27: To Test The Minimum Master To Master Clock Time And Minimum Eye Width

    Chapter 3: Testing Logic Analyzer Performance To Test the Minimum Master to Master Clock Time and Minimum Eye Width To Test the Minimum Master to Master Clock Time and Minimum Eye Width The specifications for the 16910/11A logic analyzer define a minimum master to master clock time and a minimum data eye width at which data can be acquired.

  • Page 28: Equipment Required

    Chapter 3: Testing Logic Analyzer Performance Equipment Required Equipment Required The following equipment is required for the performance test procedure. Equipment Required Equipment Critical Specification Recommended Model/Part ≥ 260 MHz, two channels, differential Pulse Generator Agilent or HP 8133A option 003 outputs, 150-180 ps rise/fall time (if faster, use transition time converters) 150 ps Transition Time Converter...

  • Page 29: Prepare The Logic Analysis System For Testing

    • any error messages • interrupt of the boot process with or without error message 4 During initialization, check for any failures. If an error or an interrupt occurs, refer to the Agilent Technologies 16900A-series Logic Analysis System Service Guide for troubleshooting information.

  • Page 30: Perform System Self-Tests

    Chapter 3: Testing Logic Analyzer Performance Prepare the Logic Analysis System for Testing Perform System Self-Tests 5 Do a self-test on the logic analysis system. a When the logic analysis system has finished booting, the Waveform window appears. Select Help→Self-Test... from the main menu. The Analysis System Self Tests window will appear.

  • Page 31: Set Up The Test Equipment

    Chapter 3: Testing Logic Analyzer Performance Set Up the Test Equipment Set Up the Test Equipment 1 Turn on the required test equipment. Let all of the test equipment and the logic analyzer warm up for 30 minutes before beginning any test. 2 Set up the pulse generator according to the following table.
  • Page 32 Chapter 3: Testing Logic Analyzer Performance Set Up the Test Equipment 3 Set up the oscilloscope. a Set up the oscilloscope according to the following tables. Oscilloscope Setup Setup: Channel 1 Setup: Ch. 1 Probe Setup: Channel 2 Setup: Ch. 2 Probe Attenuation: 1.00:1 Attenuation: 1.00:1 Scale: 100 mV/div...

  • Page 33: Connect The Test Equipment

    Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment Connect the Test Equipment Connect the 16910/11A Logic Analyzer Pod to the 8133A Pulse Generator 1 Connect a Transition Time Converter (if required—see page 28) to each of the four outputs of the 8133A pulse generator except Channel 1 OUTPUT. 2 Connect the SMA/Flying Lead test connector (see “To Assemble the SMA/ Flying Lead Test Connectors”...
  • Page 34 Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment 5 Connect the E5383A Flying Lead Probe Set’s CLK lead to the pin strip of the SMA/Flying Lead connector at the 8133A pulse generator’s Channel 1 OUTPUT. ground lead For each Flying Lead Probe connection, be sure to use a black ground lead NOTE: (five are supplied with the E5383A Flying Lead Probe Set) and orient the leads so that the ground leads are connected to the SMA/Flying Lead...
  • Page 35 Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment 7 Connect the E5383A Flying Lead Probe Set’s bits 6 and 14 to the SMA/ Flying Lead test connector’s pin strip connector at the 8133A pulse generator’s Channel 2 OUTPUT. Connect the 8133A Pulse Generator Output to the 54845A Oscilloscope 8 Attach Male BNC to Female SMA adapters to Channels 1 and 2 on the...

  • Page 36: Verify And Adjust 8133A Pulse Generator Dc Offset

    Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment Verify and adjust 8133A pulse generator DC offset 1 On the 54845A oscilloscope, select Measure from the menu bar at the top of the display. 2 Select Markers... 3 In the Markers Setup window set marker “Ay” to 0.7 V, and set marker “By”...

  • Page 37: Deskew The Oscilloscope

    Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment Deskew the oscilloscope This procedure neutralizes any skew in the oscilloscope’s waveform display. 1 On the 54845A oscilloscope, change the Horizontal scale to 200 ps/div. You can do this using the large knob in the Horizontal setup section of the front panel.
  • Page 38 Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment was set to 1 volt in the oscilloscope setup described on page 32. 6 Select Close in the Probe Setup window. 7 Select Close in the Channel Setup window.

  • Page 39: Set The 8133A Pulse Width

    Chapter 3: Testing Logic Analyzer Performance Connect the Test Equipment Set the 8133A pulse width 1 On the 8133A pulse generator, set the Channel 2 pulse width to 1.5 ns. 2 Observe the 54845A oscilloscope display. Change the Channel 2 pulse width of the 8133A pulse generator so that the pulse width measured at 1 volt on the oscilloscope is equal to 1.5 ns minus the measurement uncertainty and display resolution of the oscilloscope, further reduced by...

  • Page 40: Configure The Logic Analysis System

    Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System Configure the Logic Analysis System 1 Exit the logic analysis application (from the main menu, choose File→Exit) and then restart the application. This puts the logic analysis system into its initial state.
  • Page 41 Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System The Threshold Settings window will appear. Click here c Set the threshold value for Pod 1 of the 16910/11A logic analyzer to 1 V and select OK. d The activity indicators will now show activity on the channels that are connected to the pulse generator.
  • Page 42 Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System mainframe you can touch the touchscreen and drag across with your finger. f Click (or touch) to select channels 2, 6, 10 and 14 as shown. g Drag the scroll bar all the way to the left and ensure that the activity indicator shows activity on clock 1.
  • Page 43 Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System f Ensure that the sampling speed is set to 250 MHz in the Sampling Options box. If option 500 is not installed on the 16910/11A module, then 250 MHz will NOTE: be the only speed available.

  • Page 44: Adjust The Sample Positions Using Eye Finder

    Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System Adjust the sample positions using Eye Finder 1 Select the Sample Positions button. The Eye Finder window will appear. 2 In the “Buses/Signals” section of the Eye Finder window, ensure that the check box next to “My Bus 1”...
  • Page 45 Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System Run Eye Finder 6 Select the Run button in the Eye Finder window. 7 Ensure that an eye appears for each bit near the recommended starting position. Depending on your test setup, the eye position may vary. Any skew between channel 1 and channel 2 of your pulse generator will cause the eye position to shift to the left or right in the Eye Finder display.
  • Page 46 Chapter 3: Testing Logic Analyzer Performance Configure the Logic Analysis System To re-align a stray channel If the blue bar for a particular bit does not appear in its eye near the recommended starting position, then do the following steps to realign the sampling position of the stray channel.

  • Page 47: Test Pod 1 In 250 Mb/S Mode

    Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 250 Mb/s Mode Test Pod 1 in 250 Mb/s Mode The steps that follow include pass/fail criteria. Determine PASS/FAIL (1 of 2 tests) 1 PASS/FAIL: If an eye exists near 300 ps for every bit, and Eye Finder places a blue bar in the narrow eye for each bit, then the logic analyzer passes this portion of the test.
  • Page 48 Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 250 Mb/s Mode 3 Data will appear in the Listing Window upon completion of the run. 4 From the Main Menu choose Markers→New. a You can accept the default name for the new marker. b Change the Position field to Value.

  • Page 49: Determine Pass/Fail (2 Of 2 Tests)

    Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 250 Mb/s Mode 9 Select OK to close the New Marker window. Determine PASS/FAIL (2 of 2 tests) Pass/Fail Point: The Listing window is set up to search for the appropriate number of A's and 5's in the acquisition.

  • Page 50: Test The Complement Of The Bits (250 Mb/S Mode)

    Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 250 Mb/s Mode As a point of curiosity, you may want to determine the absolute minimum NOTE: pulse width and/or absolute maximum frequency at which data can be acquired. The “Performance Test Record” on page 60 does not include places for recording these values because the Performance Verification procedure only verifies that the logic analyzer meets specifications.
  • Page 51 Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 250 Mb/s Mode markers. See page 39 for details. 6 Adjust the sampling positions using Eye Finder. See page 44. 7 Determine pass or fail (1 of 2 tests). See page 47. 8 Switch to the Listing window by selecting the Listing tab at the bottom of the main logic analyzer window.

  • Page 52: Test Pod 2 In 250 Mb/S Mode

    Chapter 3: Testing Logic Analyzer Performance Test Pod 2 in 250 Mb/s Mode Test Pod 2 in 250 Mb/s Mode 1 Disconnect the E5383A Flying Lead Probe Set from Pod 1 and connect it to Pod 2 of the logic analyzer. Do not remove the flying leads that are connected to CLK and the data channels.

  • Page 53: Test The Complement Of The Bits (Pod 2, 250 Mb/S Mode)

    Chapter 3: Testing Logic Analyzer Performance Test Pod 2 in 250 Mb/s Mode 13 Adjust the sampling positions using Eye Finder. Be sure to expand “My Bus 1” and use the recommended starting position noted on page 44. Realign any stray channels if necessary. See page 46. 14 Determine pass or fail (1 of 2 tests).

  • Page 54: Test The Remaining Pods In 250 Mb/S Mode

    Chapter 3: Testing Logic Analyzer Performance Test the Remaining Pods in 250 Mb/s Mode Test the Remaining Pods in 250 Mb/s Mode 1 Perform the normal and complement tests for each additional pod on the logic analyzer, changing the connection to the pod, channel assignments, thresholds, etc.

  • Page 55: Determine And Set Eye Finder Position (500 Mb/S Mode)

    Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 500 Mb/s Mode 5 Assign bits 2, 6, 10, and 14 of Pod 1. 6 Ensure that the Pod 1 threshold is set to 1 volt. See page 41. Determine and set Eye Finder Position (500 Mb/s mode) 7 On the 8133A pulse generator, in the PULSE setup for CHANNEL 2, press the COMP button to return the outputs to normal.
  • Page 56 Chapter 3: Testing Logic Analyzer Performance Test Pod 1 in 500 Mb/s Mode See page 46. 18 Now set the pulse generator to the new test frequency. The logic analyzer will be tested using a double-edge clock. The test frequency is half the test clock rate because data is acquired on both the rising edge and the falling edge of the clock.

  • Page 57: Test The Complement Of The Bits (Pod 1, 500 Mb/S Mode)

    Chapter 3: Testing Logic Analyzer Performance Test Pod 2 in 500 Mb/s Mode to erase the data and continue. 25 Perform the procedure “Determine PASS/FAIL (1 of 2 tests)” on page 47. 26 Select the Run Repetitive icon 27 Perform the procedure “Determine PASS/FAIL (2 of 2 tests)” on page 49. Test the complement of the bits (Pod 1, 500 Mb/s mode) Now test the logic analyzer using complement data.

  • Page 58: Test The Complement Of The Bits (Pod 2, 500 Mb/S Mode)

    Chapter 3: Testing Logic Analyzer Performance Test Pod 2 in 500 Mb/s Mode SMA/Flying Lead test connector’s pin strip connector at the 8133A pulse generator’s Channel 2 OUTPUT. 4 Connect the Pod 2 E5383A Flying Lead Probe Set’s bits 2 and 10 to the SMA/Flying Lead test connector’s pin strip connector at the 8133A pulse generator’s Channel 2 OUTPUT.

  • Page 59: Test Pods 3 And 4 In 500 Mb/S Mode (16910A Only)

    Chapter 3: Testing Logic Analyzer Performance Test Pods 3 and 4 in 500 Mb/s Mode (16910A only) Test Pods 3 and 4 in 500 Mb/s Mode (16910A only) 1 Perform the normal and complement tests for each additional pod on the logic analyzer, changing the connection to the pod, channel assignments, thresholds, etc.

  • Page 60: Performance Test Record

    Chapter 3: Testing Logic Analyzer Performance Performance Test Record Performance Test Record LOGIC ANALYZER MODEL NO. (circle one): 16910A 16911A Logic Analyzer Serial No. Work Order No. Date: Recommended Test Interval - 2 Years Recommended next testing: TEST EQUIPMENT USED Pulse Generator Model No.

  • Page 61: Calibrating

    Calibrating This chapter gives you instructions for calibrating the logic analyzer.

  • Page 62: Calibration Strategy

    Chapter 4: Calibrating Calibration Strategy The 16910/11A logic analyzer does not require an operational accuracy calibration. To test the module against the module specifications, refer to the “Testing Logic Analyzer Performance” chapter on page 19.

  • Page 63: Troubleshooting

    Troubleshooting This chapter helps you troubleshoot the module to find defective assemblies.

  • Page 64: To Use The Flowcharts

    Start your troubleshooting at the top of the first flowchart. If the module still doesn't work correctly after completing all the procedures described in the flowchart, return it to Agilent Technologies for repair. Be sure to include a note describing the problem in detail.
  • Page 65 Chapter 5: Troubleshooting Troubleshooting Flowchart 1...
  • Page 66 Chapter 5: Troubleshooting Troubleshooting Flowchart 2...

  • Page 67: To Run The Self Tests

    Chapter 5: Troubleshooting To run the self tests 1 See “Perform System Self-Tests” on page 30. Self-Test Descriptions The self-tests for the logic analyzer identify the correct operation of major functional areas in the module. Interface FPGA Register Test. The purpose of this test is to verify that the backplane interface can communicate with the backplane FPGA.
  • Page 68 Chapter 5: Troubleshooting modes of unloading data from the acquisition RAM devices. These modes are setup by writing to registers in the Memory Controller FPGAs. These FPGAs sequence the data and perform data decoding based on the mode. DMA Test. The purpose of this test is to check the various modes of unloading data from the acquisition RAM memories using DMA backplane transfers.
  • Page 69 Chapter 5: Troubleshooting by each chip in the module. Inter-module Flag Bits Test. The purpose of this test is to verify that the 4 Inter-module Flag Bit Output lines can be driven out from the master chip in the module and received by each chip in the module. Global and Local Arm Lines Test.

  • Page 70: To Exit The Test System

    Chapter 5: Troubleshooting To exit the test system 1 Simply close the self-test window. No additional actions are required.

  • Page 71: To Assemble The 2 X 9 Test Connectors

    Chapter 5: Troubleshooting To Assemble the 2 x 9 Test Connectors To Assemble the 2 x 9 Test Connectors The 2 x 9 test connectors are used to connect all 16 channels and the clock of the logic analyzer to the pulse generator so you can test the flying lead probe and cables.
  • Page 72 Chapter 5: Troubleshooting To Assemble the 2 x 9 Test Connectors pins. e Repeat for the second 2 x 9 pin strip. 2 Attach the SMA connector: a Solder the center pin of the SMA connector to the center pin of one row on the pin strip.

  • Page 73: To Test The Cables

    Chapter 5: Troubleshooting To test the cables To test the cables This test allows you to functionally verify the logic analyzer cable and the flying lead probe of any of the logic analyzer pods. Only one probe and cable can be tested at a time.

  • Page 74: Connect The Test Equipment

    Chapter 5: Troubleshooting To test the cables Connect the test equipment 1 Using two 2 x 9 test connectors, connect the logic analyzer to the pulse generator channel outputs. a Connect the even-numbered channels to the pulse generator Channel 2 OUTPUT.
  • Page 75 Chapter 5: Troubleshooting To test the cables 3 Set up the bus and signals to test Pod 1. a From the Logic Analysis System main menu, select Setup→My 1691xA→Bus/Signal..b In the Analyzer Setup window, ensure that the Threshold button for Pod 1 is set to TTL (1.50 V).
  • Page 76 Chapter 5: Troubleshooting To test the cables indicator shows activity on clock 1. 4 Set the sampling mode. a Select the Sampling tab of the Analyzer Setup window. b Select State Mode. c Set the Trigger Position to 100% Poststore. d Set the Acquisition Depth to 128K.
  • Page 77 Chapter 5: Troubleshooting To test the cables If option 500 is not installed on the 16910/11A module, then 250 MHz will NOTE: be the only speed available. g Ensure that the Clock Mode is set to Master. h Set the clock mode to Both Edges.

  • Page 78: Adjust Sampling Positions Using Eye Finder

    Chapter 5: Troubleshooting To test the cables Adjust sampling positions using Eye Finder 1 Select the Sample Positions button. The Eye Finder window will appear. 2 In the “Buses/Signals” section of the Eye Finder window, ensure that the check box next to “My Bus 1” is checked. 3 Drag the blue bar for “My Bus 1”...
  • Page 79 Chapter 5: Troubleshooting To test the cables region. If not, see “To re-align a stray channel” on page 46. 7 Select OK to close the Sample Positions window. 8 Select OK to close the Analyzer Setup window. 9 Switch to the Listing window by selecting the Listing tab at the bottom of the main window.

  • Page 80: Connect And Configure The Logic Analyzer To Test Other Pods

    Chapter 5: Troubleshooting To test the cables Connect and configure the logic analyzer to test other pods 1 Disconnect all flying lead probes from the 2 x 9 test fixtures. 2 Connect the second E5383A Flying Lead Probe set to the next pod to be tested.
  • Page 81 Chapter 5: Troubleshooting To test the cables 11 Move the starting position to -3 ns. 12 Run Eye Finder and ensure that an eye is found for each bit. 13 Select OK to close the Eye Finder window. 14 Select OK to close the Analyzer Setup window. 15 Switch to the Listing window and run the logic analyzer.
  • Page 82 Chapter 5: Troubleshooting To test the cables 18 Return to the troubleshooting flow chart.

  • Page 83: Replacing Assemblies

    Replacing Assemblies This chapter contains the instructions for removing and replacing the logic analyzer module, the circuit board of the module, and the probe cables of the module as well as the instructions for returning assemblies.

  • Page 84: Tools Required

    Chapter 6: Replacing Assemblies CAUTION: Turn off the mainframe before installing, removing, or replacing a module. CAUTION: Electrostatic discharge can damage electronic components. Use grounded wrist-straps, mats, and standard ESD precautions when you perform any service to the mainframe or the modules in it.

  • Page 85: To Remove The Logic Analyzer Cable

    Chapter 6: Replacing Assemblies To remove the logic analyzer cable 1 Remove power from the instrument a In the session manager, select Shutdown. b At the query, select Power Down. c When the “OK to power down” message appears, turn the instrument off.

  • Page 86: To Install The Logic Analyzer Cable

    Chapter 6: Replacing Assemblies To install the logic analyzer cable 1 Connect the logic analyzer cable to the logic analyzer circuit board. a Align the logic analyzer cable end connector with the circuit board cable connector and gently apply pressure to seat the logic analyzer cable onto the circuit board connector.

  • Page 87: To Replace The Circuit Board

    Chapter 6: Replacing Assemblies To replace the circuit board 1 Remove the logic analyzer cables using the “To remove the logic analyzer cable” procedure on page 85. 2 Remove the four screws attaching the ground spring and back panel to the circuit board, then remove the back panel and the ground spring.

  • Page 88: To Return Assemblies

    • Serial number • Description of service required or failure indications 2 Remove accessories from the module. Only return accessories to Agilent Technologies if they are associated with the failure symptoms. 3 Package the module. You can use either the original shipping containers, or order materials from an Agilent Technologies sales office.

  • Page 89: Replaceable Parts

    Replaceable Parts This chapter contains information for identifying and ordering replaceable parts for your module.

  • Page 90: Ordering Replaceable Parts

    Agilent Technologies. After you receive the exchange assembly, return the defective assembly to Agilent Technologies. A United States customer has 30 days to return the defective assembly. If you do not return the defective assembly within the 30 days, Agilent Technologies will charge you an additional amount.

  • Page 91: Replaceable Parts List

    Information included for each part on the list consists of the following: • Reference designator (if applicable) • Agilent Technologies part number • Total quantity included with the module (Qty) • Description of the part Reference designators used in the parts list are as follows: •...
  • Page 92 Chapter 7: Replaceable Parts Replaceable Parts Ref. Des. Agilent Part Number Description Exchange Assemblies 16910-69501 Exchange Acquisition Board Assembly Replacement Assemblies 16910-66501 Acquisition Board Assembly 16903-68713 Replacement Thumb Screws with Sleeve, 2 sets 16900-68713 Replacement Thumb Screws with Sleeve, 6 sets 0515-2306 MSPH M3.0 x 0.5 10 mm T10 (Cable to Rear Panel)
  • Page 93 Chapter 7: Replaceable Parts Replaceable Parts Ref. Des. Agilent Part Number Description Accessories for Connectivity to the System Under Test E5383A Single-Ended Flying Lead Probe E5396A 17-pin (half-size) Single-Ended Soft Touch Probe E5394A 34-Pin Single-Ended Soft Touch Probe E5385A 100-Pin Single-Ended Probe (for Samtec connector) E5346A 38-Pin Single-Ended Probe (for...

  • Page 94: 16910A Exploded View

    Chapter 7: Replaceable Parts 16910A Exploded View Exploded view of the 16910A logic analyzer...

  • Page 95: 16911A Exploded View

    Chapter 7: Replaceable Parts 16911A Exploded View Exploded view of the 16911A logic analyzer...
  • Page 96 Chapter 7: Replaceable Parts...

  • Page 97: Theory Of Operation

    Theory of Operation This chapter presents the theory of operation for the logic analyzer card.

  • Page 98: Block-Level Theory

    Chapter 8: Theory of Operation The information in this chapter is to help you understand how the logic analyzer operates. This information is not intended for component-level repair. Block-Level Theory The block diagram of the 16910/11A logic analyzer is shown below. The 16910/11A logic analyzer...
  • Page 99 Chapter 8: Theory of Operation Probes. The 16910A logic analyzer card contains 6 probe pods; the 16911A contains 4 probe pods. Each pod is comprised of one cable and contains 16 single-ended data channels, a clock channel, two serial I2C programming lines for configuring analysis probes, +5 V for powering analysis probes, and 22 ground signals.
  • Page 100 Chapter 8: Theory of Operation onto the card and provides for control of the card by the analyzer mainframe. It also provides a path for unloading acquired data to the analyzer display. The FPGA converts bus signals generated by the mainframe processor into control signals for the logic analyzer card.

  • Page 101: Index

    Index instrument, cleaning the operating accessories acquisition assemblies mainframe test exchange maximum clock rate connectors return minimum eye width E5379A cables minimum master to master clock time equipment interval module module block-level theory clean multi-card module inspect one-card module remove performance record cable test...
  • Page 102 Index...
  • Page 103 • Do not install substitute parts or perform any unauthorized modification to the instrument. Agilent Technologies P.O. Box 2197 1900 Garden of the Gods Road Colorado Springs, CO 80901...
  • Page 104 Notices Document Warranty WARNING The material contained in A WARNING notice this document is provided © Agilent Technologies, Inc. 2001- denotes a hazard. It calls “as is,” and is subject to 2004 attention to an operating being changed, without procedure, practice, or notice, in future editions.

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