Typical Scan Configuration Parameters - Texas Instruments DLP NIRscan User Manual

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SCAN CONFIGURATION
PARAMETERS
Wavelength range
Width in nm
Number of patterns
Oversampling
Number of scans to average
The following steps create a scan configuration:
1. Click the "New/Edit/Export/Import" button in the Scan control box to invoke the Scan Configuration
dialog box.
2. The Scan Configuration dialog box shown in
The top-left section displays previous scan configurations saved to the PC.
The top-right section displays the scan configurations saved on the DLP NIRscan Nano EVM.
The bottom section displays the scan configuration parameters of the selected PC or DLP NIRscan
Nano EVM stored scan configuration.
3. Click the New button in the top-left section of the Scan Configuration dialog. Then, type the desired
spectral range between 900 and 1700 nm.
4. Select the width in nm that corresponds to the smallest wavelength content that you want to resolve.
5. Enter the desired number of wavelength points captured across the spectral range.
6. Enter the number of scans to average for corresponding back-to-back scans to average.
7. Enter a configuration name and click Save.
8. Close the Scan Configuration dialog by clicking OK.
DLPU030B – June 2015 – Revised July 2015
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Table 3-1. Typical Scan Configuration Parameters
20-nm
15-nm
CONTENT
CONTENT
900 to 1700 nm
900 to 1700 nm
20
15
80
108
2
2
18
12
Figure 3-3
Copyright © 2015, Texas Instruments Incorporated
10-nm CONTENT
900 to 1700 nm
900 to 1700 nm
10
8
160
225
2
2.25
8 to 9
6
has three sections:
Operating the DLP NIRscan Nano EVM
NIRscan Nano GUI
8-nm CONTENT
900 to 1700 nm
8
248
2.48
5
23

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