Scanning A Sample; Dlp Nirscannano Gui Scan Screen - Texas Instruments DLP NIRscan User Manual

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NIRscan Nano GUI

3.1.1 Scanning a Sample

The Scan button at the top of the NIRscan Nano GUI displays spectrum plots and controls scan
configurations and parameters, as shown in
A scan configuration must be created to scan a sample. (See
screen.) A scan configuration specifies the following parameters of a scan:
Wavelength range: Start and End wavelengths (in nm) or spectral range of interest for the scan. The
minimum wavelength is 900 nm and the maximum wavelength is 1700 nm.
Width in nm: This number must be greater than 8 nm and corresponds to the desired smallest
wavelength content that you want to resolve in a scan. The DLP NIRscan Nano optical resolution is 10
nm, so values less than 10 nm result in lower signal intensity.
Number of patterns: This number defines how many wavelength points are captured across the
defined spectral range. Depending on the previous setting, the GUI computes the maximum number of
patterns and indicates them as the "Max Limit."
Number of scans to average: This is the repeated back-to-back scans that are averaged together.
Typical scan configuration parameters for four type of scans that resolve wavelength content in 20-, 15-,
10-, and 8-nm, are shown in
22
Operating the DLP NIRscan Nano EVM
Figure
Figure 3-2. DLP NIRscanNano GUI Scan Screen
Table
3-1.
Copyright © 2015, Texas Instruments Incorporated
3-2.
Figure 3-3
for the Scan Configuration dialog
DLPU030B – June 2015 – Revised July 2015
www.ti.com
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