Injected Noise Specifications; Reliability Specifications; Table 10 Reliability Specifications - Quantum LTO-3 User Manual

Half-height tape drive
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Injected Noise Specifications

Reliability Specifications

Table 10 Reliability
Specifications
LTO-3 Half-Height Tape Drive User's Guide
The internal drive operates without degradation of error rates with 100
mV of noise injected between the chassis and 0 V at the power connector
at any frequency between 45 Hz and 20 MHz.
The LTO-3 Half-Height Tape Drive is designed for maximum reliability
and data integrity.
Table 10
Specification
Cartridge load/eject
Error recovery and
control
Mean time between
failures (MTBF)
Mean time to replace
(MTTR)
Nonrecoverable error
rate
Injected Noise Specifications
lists the reliability specifications.
Description
100,000 cartridge load/eject cycles (no thread)
• Error correction code techniques
(C1 and C2 ECC)
• Read-after-write (RAW)
• Error monitoring and reporting (error log)
• Retry on
250,000 hours MTBF at 100% duty cycle:
power applied and tape moving continuously
(tabletop drive; 50,000 hours at full load and
25°C)
Less than 30 minutes
17
Less than 1 in 10
bits
Chapter 6 Specifications
59

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