HP 54645A User's And Service Manual page 291

Index
preset configuration, 4–48
selecting, 2–26
selecting for edge trigger, 3–16
selecting for pattern trigger, 3–17
test thresholds, 7–14
testing acquisition system, 7–11
testing threshold accuracy, 7–12
turning labels on or off, 4–53
turning on and off, 2–24
characteristics
Option 005, 9–11
See performance characteristics
probe input impedance, 4–39 to 4–42
checking
package contents, 1–5 to 1–9
checklist
for solving problems, 7–4 to 7–6
circuit ground
connecting oscilloscope, 1–11 to 1–12
circuit signals
associating with input channels, 4–53 to
4–58
circuit under test
action to cause trigger, 3–4
concepts of probing, 4–39 to 4–42
clamp circuit
internal, 6–12
clamping
external, 6–12
Clear Cursors softkey, 2–30, 5–22
Clear Meas softkey, 5–29
clear measurement, 5–29
Clear softkey, 4–46
clearing labels, 4–58
clock channel
threshold accuracy, 7–12
CMOS threshold, 4–51 to 4–52
color burst, 5–21
comparators
input, 4–51 to 4–52
comparing measurement results, 4–43
complex waveforms, 3–6
components
See replaceable parts
concepts
imput impedance, 4–39 to 4–42
making accurate measurements, 4–2
probe grounding, 4–40
Index-2
probing circuit under test, 4–39 to 4–42
probing practices, 4–42
configuration
default, 2–18 to 2–19
preset default settings, 4–48
saving and recalling, 4–44
using Autoscale, 2–18 to 2–19
connecting
grabbers, 1–11 to 1–12
to circuit ground, 1–11 to 1–12
to function generator, 7–13
connecting to circuit ground, 1–11
contents of oscilloscope package, 1–6, 1–9
contents of scope package, 1–5 to 1–8
controls
front panel, 2–6
creating labels, 4–56 to 4–57
cursor measurements, 2–30 to 2–31, 5–22
to 5–25
cursors
active, 2–30, 5–22
clear, 2–30, 5–22
Cursors key, 2–30, 5–22
message, 10–6
preset configuration, 4–48
custom labels, 4–54 to 4–57
D
DAC softkey, 7–15
damaged shipment, 1–5 to 1–9
data acquisition
See acquisition
data channel
threshold accuracy, 7–12
DC level shifts, 6–12
deep memory, 5–3
default
configuration, 2–19
default configuration, 2–18
default setup, 4–48 to 4–50
defective assemblies, 8–11
defining
labels, 4–56 to 4–57
defining edge trigger, 3–20
defining sources, 3–20
delay, 2–13 to 2–14, 2–27
Delay knob, 2–32, 5–5
introduced by time base, 4–27
message, 10–4
Delayed softkey, 2–32
delayed sweep, 2–32, 6–13
characteristics, 2–32, 5–4 to 5–5
operation, 2–32, 5–4 to 5–5, 5–11
window indicator, 5–4
window Time/Div setting, 5–4
delta t/delta V
See cursor measurements
design of probe tip, 4–40
design test ports, 4–42
digital channels
acquired, 2–25
disassembly, 8–3
display
adjusting brightness of, 1–4, 1–13
and labels, 4–53 to 4–58
and trigger, 3–3
Display key, 7–38
erasing, 4–38
flashing, 2–13
of acquired data, 2–28
recovering, 4–21
removing, 8–6
sample rate, 2–27
to adjust, 7–38 to 7–39
to erase, 4–35
turning labels on or off, 4–53 to 4–55
display flashing, 2–14
display modes
average, 2–13
peak detect, 2–13
roll, 5–13
distortion
worst case, 6–10
divisions on graticule, 2–33
duplicate labels, 4–56
duration
and advanced pattern trigger, 3–14
message, 10–4
duration operators
for advanced trigger, 3–22
duration trigger, 3–19 to 3–24
dust cover, 1–7
Duty Cy softkey, 5–29