Analog Devices MicroConverter ADuC812 User Manual page 5

Parameter
DIGITAL OUTPUTS
Output High Voltage (V
OH
Output Low Voltage (V
OL
ALE, PSEN, Ports 0 and 2
Port 3
Floating State Leakage Current
Floating State Output Capacitance
POWER REQUIREMENTS
17
I Normal Mode
DD
I Idle Mode
DD
18
I Power-Down Mode
DD
NOTES
1
Specifications apply after calibration.
2
Temperature range –40°C to +85°C.
3
Linearity is guaranteed during normal MicroConverter Core operation.
4
Linearity may degrade when programming or erasing the 640 Byte Flash/EE space during ADC conversion times due to on-chip charge pump activity.
5
Measured in production at V = 5 V after Software Calibration Routine at 25°C only.
DD
6
User may need to execute Software Calibration Routine to achieve these specifications, which are configuration dependent.
7
The offset and gain calibration spans are defined as the voltage range of user system offset and gain errors that the ADuC812 can compensate.
8
SNR calculation includes distortion and noise components.
9
Specification is not production tested, but is supported by characterization data at initial product release.
10
The temperature sensor will give a measure of the die temperature directly; air temperature can be inferred from this result.
11
DAC linearity is calculated using:
reduced code range of 48 to 4095, 0 to V
reduced code range of 48 to 3995, 0 to V
DAC output load = 10 kΩ and 50 pF.
12
Flash/EE Memory Performance Specifications are qualified as per JEDEC Specification (Data Retention) and JEDEC Draft Specification A117 (Endurance).
13
Endurance Cycling is evaluated under the following conditions:
Mode = Byte Programming, Page Erase Cycling
Cycle Pattern = 00Hex to FFHex
Erase Time = 20 ms
= 100 µs
Program Time
14
I at other MCLKIN frequencies is typically given by:
DD
Normal Mode (V = 5 V): I
DD
Normal Mode (V = 3 V): I
DD
Idle Mode (V = 5 V): I
DD
Idle Mode (V = 3 V): I
DD
Where MCLKIN is the oscillator frequency in MHz and resultant I
15
I Currents are expressed as a summation of analog and digital power supply currents during normal MicroConverter operation.
DD
16
I is not measured during Flash/EE program or erase cycles; I
DD
17
Analog I = 2 mA (typ) in normal operation (internal V
DD
18
EA = Port0 = DV , XTAL1 (Input) tied to DV
DD
Typical specifications are not production tested, but are supported by characterization data at initial product release.
Specifications subject to change without notice.
Please refer to User Guide, Quick Reference Guide, Application Notes, and Silicon Errata Sheet at
ADuC812BS
V = 5 V
DD
) 2.4
4.0
)
0.4
0.2
0.4
0.2
± 10
± 5
10
14, 15, 16
43
32
26
8
25
18
15
7
50
5
range
REF
range
DD
= (1.6 nAs × MCLKIN) + 6 mA
DD
= (0.8 nAs × MCLKIN) + 3 mA
DD
= (0.75 nAs × MCLKIN) + 6 mA
DD
= (0.25 nAs × MCLKIN) + 3 mA
DD
DD
will typically increase by 10 mA during these cycles.
DD
, ADC and DAC peripherals powered on).
REF
, during this measurement.
DD
V = 3 V Unit
DD
V min
2.6 V typ
V max
0.2 V typ
V max
0.2 V typ
µA max
± 5 µA typ
10 pF typ
mA max
16 mA typ
12 mA typ
3 mA typ
mA max
17 mA typ
6 mA typ
2 mA typ
µA max
50
µA typ
5
values are in mA.
www.analog.com/microconverter
ADuC812
Test Conditions/Comments
V = 4.5 V to 5.5 V
DD
= 80 µA
I
SOURCE
V = 2.7 V to 3.3 V
DD
= 20 µA
I
SOURCE
I = 1.6 mA
SINK
I = 1.6 mA
SINK
I = 8 mA
SINK
I = 8 mA
SINK
MCLKIN = 16 MHz
MCLKIN = 16 MHz
MCLKIN = 12 MHz
MCLKIN = 1 MHz
MCLKIN = 16 MHz
MCLKIN = 16 MHz
MCLKIN = 12 MHz
MCLKIN = 1 MHz
for additional information.