Test Data And Performance Curves; Emi Performance; Surge Immunity; Figure 5-1. Cm Conducted Emissions With Aef Enabled (Blue) And Disabled - Texas Instruments TPSF12C3QEVM User Manual

www.ti.com

5 Test Data and Performance Curves

Because actual performance data can be affected by measurement techniques and environmental variables,
these curves are presented for reference and can differ from actual field measurements. Unless otherwise
indicated, V = V = 12 V.
VDD EN

5.1 EMI Performance

See the Schematic and Bill of Materials
Figure 5-1. CM Conducted Emissions with AEF Enabled (Blue) and Disabled (Red)

5.2 Surge Immunity

V 500 V/DIV
LINE
V 20 V/DIV
INJ-C
V 10 V/DIV
SENSE1
I 2 A/DIV
SENSE1
Figure 5-2. IEC 61000-4-5 Positive Surge, 5-kV Single Strike – 1 µs/div (a), 200 µs/div (b)
V 500 V/DIV
LINE
V 20 V/DIV
INJ-C
V 10 V/DIV
SENSE1
I 2 A/DIV
SENSE1
Figure 5-3. IEC 61000-4-5 Negative Surge, 5-kV Single Strike – 1 µs/div (a), 200 µs/div (b)
SLVUCM2 – JANUARY 2023
Submit Document Feedback
for details of the EVM components for this measurement.
INJ TVS diode clamps
SENSE internal
protection clamps
1 µs/DIV
(a)
INJ TVS diode clamps
SENSE internal
protection clamps
1 s/DIV
(a)
Copyright © 2023 Texas Instruments Incorporated
V 500 V/DIV
LINE
V 20 V/DIV
INJ-C
V 10 V/DIV
SENSE1
I 2 A/DIV
SENSE1
V 500 V/DIV
LINE
V 20 V/DIV
INJ-C
V 10 V/DIV
SENSE1
I 2 A/DIV
SENSE1
TPSF12C3QEVM Active EMI Filter Evaluation Module for Three-Phase AC
Test Data and Performance Curves
Negative undershoot
eventually decays
INJ TVS diode clamps
SENSE internal
protection clamps
200 µs/DIV
(b)
Positive overshoot
eventually decays
INJ TVS diode clamps
SENSE internal
protection clamps
200 s/DIV
(b)
Power Systems
9