Self-Test Errors - Keysight 33210A User Manual

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Chapter 5 Error Messages

Self-Test Errors

Self-Test Errors
The following errors indicate failures that may occur during a self-test.
Refer to the Keysight 33210A Service Guide for more information.
Self-test failed; system logic
This error indicates a failure of the main processor, system RAM, or
system ROM.
Self-test failed; waveform logic
This error indicates that the waveform logic in the synthesis IC has
failed.
Self-test failed; waveform memory bank
This error indicates that either the waveform RAM or the synthesis IC
has failed.
Self-test failed; modulation memory bank
This error indicates that the modulation memory bank in the synthesis
IC has failed.
Self-test failed; cross-isolation interface
This error indicates that the cross-isolation interface between the main
processor and the synthesis IC has failed, or that the synthesis IC itself
has failed.
Self-test failed; pulse phase locked loop
This error indicates that a phase locked loop in the pulse waveform
synthesizer is not correctly locking, and that the frequency of pulse
waveforms (only) may not be correct. Indicates a failure of the synthesis
IC or associated circuitry.
619: Self-test failed; leading edge DAC
620: Self-test failed; trailing edge DAC
621: Self-test failed; square-wave threshold DAC
623: Self-test failed; dc offset DAC
624: Self-test failed; null DAC
625: Self-test failed; amplitude DAC
These errors indicate a malfunctioning system DAC, failed
DAC multiplexer channels, or associated circuitry.
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