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NTEGRA Therma Probe NanoLaboratory. Instruction Manual
7.2. Semicontact AFM
The measurements by the AFM-techniques are discussed in detail in the book "Performing
measurements", Part 3, Chapter 3, Section "Semicontact Mode". Hence, only a sequence
of main operations and a detailed description of the stages which differ from the standard
procedure are given here.
Before making measurements switch off the optical microscope illuminator because
residual voltage fluctuations of the illuminator lamp cause noise at double the frequency of
the power supply voltage (100/120 Hz for mains frequency 50/60 Hz).
Basic operations of SemiContact Mode
1. Setting the instrument for working in SemiContact Modes (select SemiContact in the
list-box on the main parameters bar).
2. Setting the Piezodriver Working Frequency (see i.
− Setting Mag Signal Initial Level;
− Setting "Feedback Gain" Factor Working Level.
3. Landing the Sample to the Probe (see i.
4. Changing the Temperature of the Sample (ess i.
5. Setting the Scanning Parameters and Scanning (see i.
− Scanning;
− Saving the Obtained Data.
6. Finishing the Measurements (see i.
7.2.1.
Setting the Piezodriver Working Frequency
1. Switch to the Resonance tab (the button
2. In the control panel of the Resonance tab set the following parameters (Fig. 7-10):
− Amplitude – 0.2 x 10;
− Gain - 10;
− DFL signal gain - x10.
3. Start the procedure of automatic resonance frequency determination by clicking the
button
.
42
7.2.5
Fig. 7-10. The control panel of the Resonance tab
7.2.1
on page 42):
7.2.2
on page 43).
7.2.3
on page 46).
7.2.4
on page 48):
on page 48).
on the main operations panel)
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