Create Custom Test Patterns; Create Static Test Pattern - Zeiss Humphrey Field Analyzer 3 Instructions For Use Manual

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Setup and Testing

Create Custom Test Patterns

To create a custom pattern:
1. Go to Settings
You should see a list of patterns if any exist.
2. To view a pattern, highlight it and select View. To create a new
pattern, select Create Static Test Pattern
Pattern.
Note: A custom Static Test Pattern can be used as either a Threshold
or Suprathreshold test.
Note: The SITA test strategy cannot be used in a custom test.

Create Static Test Pattern

After Create Static Test Pattern is chosen, a message displays stating that the pattern created will
specify the right eye (OD). A mirror image of the pattern will be created for the left eye (OS).Select
OK.
The next screen displays the following features:
• Test Field - Create test points by directly touching or clicking on the test field. X, Y values are
displayed to the right.
• Test Pattern - Select either Single or Grid to create single points or a grid pattern, respectively.
Single points can be added to a Grid Point Pattern and a grid of points can be added to a
Single Point Pattern. A test pattern can hold a maximum of 248 points.
• Field Size - Changes the field view display. This has no effect on the pattern itself, but point
placement is easier in the central portions of the field of view by selecting 10 degrees (10°) or
30 degrees (30°). 90 degrees (90°) displays the entire field in degrees.
• Point Spacing - This option is only available when the Grid test pattern is selected and is the
distance allowed between points (Two, Four, Six, Eight, Ten, Twelve degrees).
• Delete Point - Touch or click on a point to highlight it (the point will turn blue) and delete by
selecting Delete Point.
HFA3 Instructions for Use
Go to Contents
> Specific Settings > Custom Test Patterns.
or
Create Kinetic Test
2660021166131 Rev. A 2018-11