Keysight N7744A User Manual page 71

4
Specifications and Regulations Compliance
70
Measurement: Using a laser source without spectral ripple or with
known (monitored) spectral ripple and linewidth < 100 MHz and
stepping the wavelength over the specified range. The periodic part in
the measurement result is separated by subtracting the polynomial 2nd
order fit (low frequency part).
Storage conditions
Allowed temperature and humidity range for the non-operating
instrument. Wait for acclimation to within the "Operating temperature"
before turning on the instrument.
Total uncertainty
The maximum relative difference U between measured (displayed)
power M and actual (true) power P for a specified set of operating
conditions, expressed in percent. Powers expressed in Watts. Excluding
"Noise pp (dark)" (see,
(dark)" (see, "Drift (dark)" on page
U = 100% * (M/P - 1)
Conditions: Operating conditions as specified. Other conditions as
specified.
Uncertainty at reference conditions
The maximum relative difference U between measured (displayed)
power M and actual (true) power P for the specified set of reference
conditions, including all uncertainties in the calibration chain from the
national calibration laboratory to the test meter, expressed in percent.
Powers expressed in Watts.
U = 100% * (M/P - 1)
Conditions: Reference conditions as specified.
Wavelength range
The range of wavelengths for which the power meter is calibrated, or
that can be set at the attenuator and for which the specifications apply
(if not differently stated).
"Noise pp (dark)" on page
63).
65) and "Drift
Keysight N774x Series