Agilent Technologies B1500A Training Manual page 6

Semiconductor device analyzer
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Class Exercises
Class exercises use the test setup listed below. The test setup data are only examples and
included in the Demo.xpg file stored in the Manual CD-ROM.
Module
Module 1
no exercise
Module 2
Id-Vd measurement
Id-Vg, gm-Vg measurement
B2200/E5250 switch control
Module 3
Id-Vg, gm-Vg measurement
Using Preview window
Module 4
Id-Vd measurement
Multi Channel I/V Sweep
Measurement
I/V List Sweep Measurement
I/V-t sampling measurement
C-V sweep measurement
B2200/E5250 switch control
Direct Control (C-f measurement)
Module 5
Id-Vd measurement
SMU series connection
SMU parallel connection
Re measurement, kelvin connection
Module 6
Leak current measurement
Ultra low current measurement
Id-Vg measurement
Gummel plot
Module 7
SMU pulse mode
RC measurement
Negative hold time
Auto analysis
Bias hold function
SMU series resistor
Exercise
Device
Test setup/definition/data
MOSFET
CMOS: Id-Vd
MOSFET
CMOS: Vth gmMax
-
-
MOSFET
GMMAX.xtr
-
-
MOSFET
Trng Id-Vd
Bipolar Tr
Trng Multi
LED
MOSFET
Trng List
0.1 μF
Trng Sampling
MOSFET
Trng CV
-
Trng Switch
0.1 μF
Trng C-f
MOSFET
IDVD, Id-Vd
511 kohm
IRVR
1 ohm
Parallel
Bipolar Tr
REKELV
-
Zero-check
-
Zero-check-ASU
MOSFET
IDVG
Bipolar Tr
GUMMEL
MOSFET
IDVD-Pulse
0.1 μF and
RC-sampling-log
511 kohm
511 kohm
R-sampl-neg-hold
MOSFET
GMMAX
LED
LED
511 kohm
IV-res
Page
2-19, 27
2-19, 27
2-32
3-28
3-31
4-25
4-37
4-51
4-64
4-76
4-81
4-88
5-7
5-24
5-28
5-38
6-9
6-19
6-20
6-25
7-8
7-16
7-22
7-28
7-35
7-43

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