Agilent Technologies B1500A Training Manual page 24

Semiconductor device analyzer
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Module 5
Basic Measurement
Basic Sweep Measurement
VAR1
Single Sweep
Double Sweep
Linear Sweep
Log Sweep
The SMUs can now sweep up to a value and then back down (double sweep). This feature is useful
when the device must be tested without abruptly removing the forcing condition.
Log sweeps are required any time the measurement results span many decades, such as a MOS
subthreshold curve.
The variable used to set the SMU to a basic sweep is VAR1. It may be called the primary sweep.
5-4

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