Agilent Technologies B1500A Training Manual page 94

Semiconductor device analyzer
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Class Exercise
SD214DE MOS Subthreshold
With lid closed, you should see this typical response using the IDVG setup data. If the subthreshold
region is much higher, at the pA or nA level, the MOS device may be statically damaged. Replace
the device using the handling procedure detailed on the previous page.
6-22
Module 6
Low Current Measurement

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