Self-Test Mode - Siemens SICAM Manual

Modbus Registers
B.9 Self-Test Mode
B.9

Self-Test Mode

In SICAM FCM, the self-test mode feature can be enabled during the commissioning and when required. The
self-test mode is activated via any of the following:
•
HMI
•
RS485/Modbus interface
During the self-test mode, the device changes the values of all Modbus registers and provides an option for
the user to verify the Modbus registers in a sequential order as per the defined-time interval.
In the self-test mode, the correct mapping of all the available Modbus registers (excluding the holding regis-
ters) in a Modbus master and control center can be tested in a very convenient and fast manner. A Modbus
master can read out all the registers and provide them with a time stamp and forward the data to the control
center. In the control center, the received data can be arranged based on the time stamps and should have the
same order as per the following pre-defined self-test mode description.
The self test starts by verifying the hardware in the following sequence:
•
LED Test
•
I>> (forward direction) trip test with DO1 active
•
I> (reverse direction) trip test with DO2 active
•
I > (undetermined direction) trip test with DO1 and DO2 active
N
After completion of self test, all the coil registers and the discrete input registers (except registers related to
self test) are reset.
The individual Modbus coil registers and the discrete input registers are set for a duration of 5 s and then
reset. After completion of the self test, coil and discrete input registers display the real-time values.
During input-register test, all input registers are set with predefined known values for 10 s. The check using
the time stamp is not necessary as the predefined unique analog values can provide a check of the correct
mapping of the registers. All the input registers display individual measuring values again once the device
exits from the self-test mode. The self-test mode takes 3 min to 4 min to complete.
The following tables display the sequence of the test state and test-state duration.
Modbus Discrete
Input Register
Address
–
3, 9, 23, 24, 26, 27, 28 I>> trip test
10, 22, 23, 24, 26, 27,
28
4, 11, 12, 29, 30, 31,
32
Table B-17
Modbus Register
Address
1
2
3
4
5
6
7
8
156
Parameter
LED test
I> trip test
I > trip test
N
Bit-Type Data Coil
Parameter
Test mode
Reset display
Reserved for future use
Counter reset
DO 1
DO 2
Clear data available status
Clear events database
Individual Test Value Time Duration
1 10 s
1 10 s
1 10 s
1 10 s
Individual Test Value Time Duration
1 Entire duration of self-
test mode
1 5 s
– –
1 5 s
1 5 s
1 5 s
1 5 s
1 5 s
SICAM, Feeder Condition Monitor, Manual
E50417-H8940-C580-A4, Edition 03.2019