Select Devices To Measure And Measurement Type Ui - Ossila FACT1 User Manual

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Select devices to measure and measurement type UI

This UI allow the User to specify the type of measurement to execute, select the devices to measure,
and enter experiment identification tags and data logging controls.
Measurement type
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Measure All forces SuperFACT to acquire both IV and TC curves for
all 20 devices. You can deselect IV or TC sweeps and specific devices
by using the corresponding controls on this UI, see below.
Output (IV) selects/deselects output characteristic (IV sweep)
acquisition.
Transfer selects/deselects transfer (TC) sweeps. To calculate the
mobility and the other transistor figures of merit, this control must
be selected.
Stress Bias enables the SuperFACT bias capability. In Stress Bias
mode, SuperFACT can be programmed to execute up to four
acquisition cycles at specified time-interval. During the time -
intervals between two consecutive cycles, the DUTs can be kept at a
constant bias voltage V
bias
Important: The Voltage is applied to the selected DUTs on a column-
by-column basis, i.e. that if at least one device belonging to a
column is selected, the entire column will be kept under biased.
Lifetime enables SuperFACT continuous measurement mode
whereby the user can set infinitely repeating acquisition cycles.
Tip: Select Lifetime in conjunction with Sweep Bias to combine
continuous and stress biased measurements.
Copyright © 2009-2015
, with |V |≤ 10V.
bias
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