Ossila FACT1 User Manual page 45

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2. Upon pressing Create Exp, the current UI is closed and replaced by "Select Devices to
Measure and Measurement Type" UI.
3. Under Measurement Type, select Output (IV) and Transfer to measure both output and
transfer characteristics curves of the DUT.
4. To select the entirety of the devices on the substrates, press the DUT button under Target.
Single devices can be selected/deselected by pressing the corresponding buttons on the
device 'keypad' inside the Target subpanel.
Note: The position and numbering of the device buttons mirror the layout of the transistor
on the substrates.
5. Select the active gate channels by choosing the option Edge on the Gate ring control to
activate both the rightmost and leftmost gate pads. This control is located at the bottom of
the Target panel.
Tip: To minimise gate leakage current, it is recommended activating only the gate pads
strictly required to charge the FET dielectric.
6. Fill in the entry fields on the Log Data panel (User Name, Experiment Name, Substrate Type
and File Name) and use the browse button of Folder Name to choose the directory in which
the data files are to be stored.
7. Instruct SuperFACT to save all the data files in an appositely created folder and append a
time stamp to the data files (and folder) by enabling these options through the Create
Folder and Time Stamp buttons located next to the File Name input.
8. Press Apply to proceed to the Measurement Settings and Device Parameters UI
Figure 19. Select Devices to Measure and Measurement Type UI.
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