Overview - Ossila FACT1 User Manual

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Overview

The Ossila Fast Automated Characterisation and Test (SuperFACT) system is designed to make
testing and characterisation of organic field effect transistors as simple as possible when combined
with Ossila's FET substrate systems. Fabrication of devices can be as simple as spin-coating a
material on a test-chip and loading it into the system. The automated test routines will then perform
output and/or transfer sweeps and automatically calculate the key OFET/TFT parameters for each of
the twenty devices on the substrate.
SuperFACT multiplexor makes use of a 2D array of gold-coated spring-loaded probes (POGOS) to
connects the devices to the source-meter(s), while the transistor to measure are selected through a
high performance switching network.
At the core of the measurement system is a computer controlled Keithley dual source-measure unit
with maximum output of ±100 V and accuracy up to 10 pA. The Multiplexer Measurement Unit is
highly specified to introduce the minimum amount of distorsion in the measurement as possible.
The resistance introduced in each Drain path is ˂ 1 Ω, leakage/noise current is ˂ 500 pA and
capacitance is ˂ 300 pF. This combined high level of output voltage and accuracy makes for
maximum experimental versatility and speed.
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