Table of Contents
Advertisement
Diagnostic Program Output Example (E8000 + EVCHIP Test) (cont)
(2) RANGE TRACE TEST
(3) SUBROUTINE/RANGE TRACE TEST
(4) TRACE STOP TEST
(5) TRACE SPECIAL CONDITION TEST
(6) TRACE SUPPRESS TEST
(7) INRAM TRACE TEST
TEST24 ERAM TIME MEASURE TEST
(1) SUBROUTINE TIME MEASURE TEST1
(2) SUBROUTINE TIME MEASURE TEST2
(3) SUBROUTINE TIME MEASURE TEST3
(4) TIME STUMP TEST
TEST25 ERAM PARALLEL MONITOR TEST
TEST01 FLASH MEMORY READ TEST
(a)
(b)
(1) MONITOR SUM CHECK
Description:
(a) Test item number
(b) Test item
(c) Execution count
(d) Test result
OK
OK
OK
OK
OK
OK
(COUNT = 001)
OK
OK
OK
OK
(COUNT = 001)
(COUNT = 002)
(c)
OK
(d)
22
OK
Advertisement
Table of Contents
