ABB RED670 Commissioning Manual page 187

Line differential protection
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1MRK 505 378-UUS Rev. J
NO TRIP signal should appear due to symmetrical condition.
14.
Deactivate the CLOSECMD. Decrease one current with 120% of the current unsymmetrical level
compared to the other two phases. Activate CLOSECMD and measure the operating time of the
CCPDSC (52PD) protection.
Use the TRIP signal from the configured binary output to stop the timer.
15.
Deactivate the CLOSECMD. Decrease one current with 80% of the current unsymmetrical level
compared to the other two phases. Activate CLOSECMD.
NO TRIP signal should appear.
11.5.11.2
Completing the test
Continue to test another function or end the test by changing the TESTMODE setting to Disabled.
Restore connections and settings to the original values, if changed for testing purposes.
11.5.12
Directional underpower protection GUPPDUP (37)
Prepare the IED for verification of settings as outlined in section
for test"
in this chapter.
11.5.12.1
Verifying the settings
The underpower protection shall be set to values according to the real set values to be used.
The test is made by means of injection of voltage and current where the amplitude of both current and
voltage and the phase angle between the voltage and current can be controlled. During the test, the
analog outputs of active and reactive power shall be monitored.
1.
Connect the test set for injection of voltage and current corresponding to the mode to be used in
the application. If a three-phase test set is available this could be used for all the modes. If a single-
phase current/voltage test set is available the test set should be connected to a selected input for
one-phase current and voltage.
Table 39:
Set value: Mode
A, B, C
Arone
PosSeq
Table continues on next page
Line differential protection RED670
Commissioning manual
Calculation modes
Formula used for complex power calculation
=
S
V
A
EQUATION2055 V1 EN-US
=
S
V
AB
EQUATION2056-ANSI V1 EN-US
= ×
S
3
V
EQUATION2057-ANSI V1 EN-US
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"Requirements"
*
*
×
+
×
+
×
I
V
I
V
I
A
B
B
C
C
*
*
×
-
×
I
V
I
A
BC
C
*
×
I
PosSeq
PosSeq
Testing functionality by secondary injection
and section
*
Section 11
SEMOD55625-106 v4
SEMOD175027-3 v5
"Preparing
SEMOD175027-7 v7
(Equation 83)
(Equation 84)
(Equation 85)
181

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